Comprehensive measurement and debug solution

  • Characterizes CEI-56G-VSR/MR/LR TX designs defined by OIF-CEI-04.0
  • Performs over 100 tests
  • Key measurements include jitter, eye linearity, SNDR, eye-opening (EW6, EH6), and return loss

Flexible and extensible

  • Operate on an N1000A/86100D DCA-X oscilloscope, or on a PC connected to an N109x DCA-M via USB
  • Automatic HTML report generation
  • Test all or selected parameters to compliance limits or custom limits


  • N1000A DCA-X Mainframe
  • 86100D DCA-X Mainframe
  • N109X DCA-M Oscilloscope
  • N107X Clock Recovery

The Keysight N109256CB TX test application can be used with the N1000A/86100D DCA-X or N109X DCA-M Series oscilloscopes to quickly and accurately perform NRZ and PAM4 measurements according to:

  • CEI-56G-VSR (Reference OIF2014.277.08 NRZ, OIF-CEI-04.0 PAM4)
    • Section 15.3.2 Host to Module at TP1a, Table 15-1 (NRZ)
    • Section 15.3.3 Module to Host at TP4, Table 15-4 (NRZ)
    • Appendix 15.B.1.1 Host-to-Module at TP0a, Table 15.9 (NRZ)
    • Section 16.3.2 Host to Module at TP1a (Host Output), Table 16-1 (PAM4)
    • Section 16.3.3 Module to Host at TP4 (Module Output), Table 16-4 (PAM4)
    • Appendix 16.B.1.1 Host to Module at TP0a, Table 16.10 (PAM4)
  • CEI-56G-MR (Reference OIF-CEI-04.0)
    • Section 17.3.1, Table 17-2 and 17-3 (MR-PAM4)
  • CEI-56G-LR (Reference OIF-CEI-04.0)
    • Section 21.3.1, Tables 21-2, 21-3 (LR-PAM4)

The N109256CB is an easy-to-use TX test application that:

  • Saves time in understanding details of standards
  • Reduces the time it takes to characterize your PAM4 and NRZ design from hours to minutes
  • Helps debug your device using custom configurations
  • Allows you to quickly generate HTML reports that summarize the performance of your device

Key measurements include:

  • Jitter Measurements including UUGJ, BUJ, Even-Odd Jitter (EOJ)
  • Output Waveform measurements including Steady-State Voltage (Vf), Linear Fit Pulse Peak and Signal-to-Noise-and-Distortion (SNDR)
  • Transition Time
  • Eye Width (EW6) and Eye Height (EH), Far-end and Near-end
  • Return Loss

For a comprehensive and up-to-date list of specific tests covered by the application, download and install the N109256CB .exe onto a PC (click the Trials and Licenses tab), and run the application in “Demo Mode”. No license (or hardware) is required to run the software application in “Demo Mode”.

Free Trials

N109256CB TX Test Application Software and 30-Day Trial License

  • Request a 30-day free trial of the software
  • Enables the application on your PC
  • Evaluate full-featured version with no functionality restrictions

Extend the capabilities for your Electrical TX Test SW for OIF-CEI-4.0

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