N109212CA Electrical TX Test Software for OIF-CEI-112G

The Keysight N109212CA TX test application can be used with the N1000A DCA-X oscilloscopes to quickly and accurately perform PAM4 measurements according to:

• CEI-112G-VSR (Reference OIF-CEI-05.1)
  • Section 25.3.2 Host-to-Module at TP1a, Table 25-1
  • Section 25.3.3 Module-to-Host at TP4, Table 25-4
  • Appendix 25.C.2 Host-to-Module at TP0a, Table 25-15
• CEI-112G-MR-PAM4 (Reference OIF-CEI-05.1)
  • Section 26.3.1 Table 26-3 and 26-4 (MR-PAM4)
• CEI-112G-LR-PAM4 (Reference OIF-CEI-05.1)
  • Section 27.3.1 Table 27-3 and 27-4 (LR-PAM4)
• CEI-112G-LINEAR-PAM4 (Reference oif2021.405.10)
  • Section 29.3.3 Host-to-Module at TP1a, Table 29-1
  • Section 29.3.4 Module-to-Host at TP4, Table 29-4

The N109212CA is an easy-to-use TX test application that:

• Saves time in understanding details of standards
• Reduces the time it takes to characterize your PAM4 design from hours to minutes
• Helps debug your device using custom configurations
• Allows you to quickly generate HTML reports that summarize the performance of your device

Key measurements include:

• Jitter Measurements including EOJ, J3/4/5U, JRMS of a PRBS13Q
• Output Waveform measurements including Steady-State Voltage (Vf), Linear Fit Pulse Peak and Signal-to-Noise-and-Distortion (SNDR)
• Transition Time
• Eye Height, Vertical Eye Closure, Near-End & Far-End Eye measurement
• EECQ, CEEQ & VMA
• Return Loss

Comprehensive measurement and debug solution

• Characterizes CEI-112G-VSR/MR/LR/LINEAR TX designs defined by OIF-CEI-112G
• Performs over 100 tests
• Key measurement includes jitter, SNDR, Vertical Eye Closure, eye linearity and return loss

Flexible and extensible

• Operates on an N1000A DCA-X oscilloscope, or on a PC connected to an N1000A DCA-X via LAN
• Automatic HTML report generation
• Test all or selected parameters to conformance limits or custom limits

Compatible

• N1000A DCA-X mainframe
• N107x Clock Recovery
• N104xA/B Remote head