E6832A W-CDMA Cal Application for the E6601A Wireless Communications Test Set

This product will be discontinued with a last order date of October 31, 2011. It will be replaced by the E1963A, one of the E5515C applications.

Features

• W-CDMA ARB source for flexible phone receiver (RSSI) testing
• Full set of high-speed transmitter measurements support all W-CDMA/HSDPA chipset calibration
• Dynamic Power provides fast series of power measurements for high-speed amplitude characterization (requires chipset support)
• Optional Fast Device Tune capability combines Dynamic Power, frequency hopping and simultaneous source (RSSI) for high-speed transmitter and receiver characterization of supported chipsets

Accuracy

• QPSK Modulation Residual EVM < 10% (< 3% typical)
• Channel Power measurement < +\- 0.6 dB (< +\- 0.3 dB typical)
• EVM measurement < +\- 2.5% rms

Dynamic Range

• Channel Power measurement -65 dBm to +28 dBm
• Waveform Quality measurement -25 dBm to +28 dBm

The Keysight E6832A W-CDMA cal application for the E6601A test set provides all the necessary capabilities to calibrate your W-CDMA and HSDPA mobile devices. This cal application, designed for non-signaling test in high-volume manufacturing, helps you achieve your time-to-market goals while lowering your cost of test for W-CDMA and HSDPA wireless devices.

This W-CDMA/HSDPA test solution is based on the new, next-generation, high-performance E6601A test set. You gain the benefits of industry leading measurement speed, optional time-based and portable licensing, and an integrated open Windows PC. With applications focused on calibration, flexible licensing, a built-in PC and high-speed measurements, the next-generation capabilities of this test set offers a UMTS calibration solution that can increase your throughput and reduce your test costs.

• ARB source for flexible phone receiver (RSSI) testing
• Fullset of transmitter measurements:
  - Mean Power and RRC-filtered Power
  - Adjacent Channel Leakage Ratio
  - Spectrum Emission Mask
  - EVM
  - Frequency Error
  - Peak Code Domain Error
  - Occupied Bandwidth
• Dynamic power for fast series of power measurements
• High-performance Spectrum Monitor
  - Spectral analysis in a Windows interface
• Optional Fast Device Tune capability
  - Simultaneous Tx Power and RSSI measurements in 20 ms step sizes
  - Upgrade available for variable step sizes from 5 ms to 20 ms