Trade show
Design for Analysis. Validate with Confidence.
Join Keysight at the International Symposium for Testing and Failure Analysis (ISTFA) 2026 in San Antonio, Texas, where engineers and failure analysis experts come together to explore the latest advances in microelectronics testing, debugging, and reliability.
Centered on this year's theme, Design for Analysis, ISTFA brings together engineers and industry experts to share practical insights and emerging approaches for today's semiconductor design and reliability challenges.
Explore practical techniques for investigating failures, validating designs, and improving test workflows.
Conference Highlights
Visit Keysight at Booth #721
Discover solutions that help accelerate debugging, simplify failure analysis, and validate designs with confidence through live demonstrations featuring:
Schedule a Demo. Receive a Complimentary Exhibit Pass.
Schedule a demonstration with a Keysight expert and receive a complimentary exhibit pass using our exclusive registration code.
Book your demo today and visit us at Booth #721.
Microelectronics engineers, semiconductor designers, failure analysis professionals, reliability engineers, test engineers, researchers, and anyone responsible for device characterization, debugging, validation, or product quality.
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