Trade show
Design for Analysis. Validate with Confidence.
Join us at the International Symposium for Testing and Failure Analysis (ISTFA) 2026 in San Antonio where engineers and failure analysis experts come together to explore the latest advances in microelectronics testing, debugging, and reliability.
Centered on this year's theme, Design for Analysis, ISTFA brings together engineers and industry experts to share practical insights and emerging approaches for today's semiconductor design and reliability challenges. Explore practical techniques for investigating failures, validating designs, and improving test workflows.
Visit Keysight at Booth #721
Discover solutions that help accelerate debugging, simplify failure analysis, and validate designs with confidence through live demonstrations featuring:
Schedule a Demo. Receive a Complimentary Exhibit Pass.
Schedule a demo with a Keysight expert to receive a complimentary exhibit pass.
Conference Highlights |
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AI Applications for Failure Analysis
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Emerging FA Techniques and Concepts |
Focused Ion Beam Circuit Edit
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Sample Preparation and Device De-processing |
Die Level Fault Isolation
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Package Level Fault Isolation
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Case Studies: FA Process and Workflows |
FIB Sample Preparation
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Packaging and Assembly
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System in Package and 3D Devices
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Product Yield, Test and Diagnostics |
Microscopy Analysis and Material Characterization |
Wide Bandgap Power Devices (SiC, GaN, new materials) |
Boards and Systems
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Trusted Electronics
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Case Studies: Device Analysis
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Microelectronics engineers, semiconductor designers, failure analysis professionals, reliability engineers, test engineers, researchers, and anyone responsible for device characterization, debugging, validation, or product quality.
What are you looking for?