Wide-bandgap (WBG) semiconductor materials such as gallium nitride (GaN) require testing both static and dynamic parameters to avoid loss during the switching transient. A double-pulse testing (DPT) system can perform dynamic tests based on the JEDEC standards for WBG semiconductors, including turn-on, turn-off, switching, reverse recovery, and gate charge.
The DPT system should include instrumentation, probes, a safety system, automated control software, autocalibration routines, a test fixture, and test boards for different device configurations. Also needed is a load inductor. Once the equipment is set up, input the board parameters in the hardware configuration menu of the software and specify the desired external inductor and its value. Next, set up the R²GC current sensor. Once done, select the device to configure the test.
How to Test Wide-Bandgap Semiconductors
As an off-the-shelf measurement solution, the PD1500A delivers reliable, repeatable measurements of wide-bandgap semiconductors. The platform ensures user safety and protection of the system’s measurement hardware.
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Additional resources for characterizing WBG semiconductors