How to Test Wide-Bandgap Semiconductors

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Characterizing WBG Semiconductors with Double-Pulse Test

Wide-bandgap (WBG) semiconductor materials such as gallium nitride (GaN) require testing both static and dynamic parameters to avoid loss during the switching transient. A double-pulse testing (DPT) system can perform dynamic tests based on the JEDEC standards for WBG semiconductors, including turn-on, turn-off, switching, reverse recovery, and gate charge.

The DPT system should include instrumentation, probes, a safety system, automated control software, autocalibration routines, a test fixture, and test boards for different device configurations. Also needed is a load inductor. Once the equipment is set up, input the board parameters in the hardware configuration menu of the software and specify the desired external inductor and its value. Next, set up the R²GC current sensor. Once done, select the device to configure the test.

Double-Pulse Test Solution

Perform double-pulse testing (DPT) using a semiautomated calibration method and measurement technique. The Keysight dynamic power device analyzer / double-pulse tester is an all-in-one test solution that enables reliable, repeatable measurement of wide-bandgap (WBG) (SiC, GaN) power semiconductor dynamic characteristics to comply with JEDEC specifications. The following measurement techniques are included: probe compensation, offset adjustment, de-skewing, and common mode noise rejection.

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