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Highlights

Keysight provides test solutions for fast and efficient integrated and silicon photonics wafer and chip level test.

Wavelength and polarization dependent optical and electro-optical measurements from 1240–1640 nm:

  • Photonic application suite
  • Tunable lasers
  • Polarization synthesizers
  • Optical power meters and source measure units (standalone and modular)
  • Optical signal conditioning with optical switches and attenuators

High frequency electro-optics measurements up to 110 GHz:

  • Lightwave component analyzers
  • Optical modulation analyzers

Wafer probing with FormFactor Silicon Photonics CM300xi probe station

Test automation:

  • Test recipes, measurement plan definition and execution with KS8400A Keysight test automation platform (TAP)
  • Automated wafer probe station control with N7700210C Wafer prober TAP plug-in
  • Automated E/O and O/E LCA measurement with N4370P01A LCA TAP plug-in

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N7700100C
Photonic Application Suite
The Keysight Photonic Application Suite is a collection of advanced and basic software tools for automating optical measurements and analysis, especially for determining wavelength and polarization dependence of fiber optic network components.
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N4370P01A
N4370P01A LCA TAP Plug-In
Simplifies automation of LCA RF/optical measurements with TAP.
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KS8400A
KS8400A PathWave Test Automation
Test sequencer software with timing analyzer, result viewer, and other useful tools for test automation development.
Starting from  
N7700210C
N7700210C Wafer Prober TAP Plug-In
Easily integrate wafer prober control within TAP test sequences for fully automated wafer and chip scale test solution for Integrated Photonics.
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Featured Resources

Brochures 2019.09.18

Integrated Photonics

Integrated Photonics

Integrated Photonics, often called Silicon Photonics, promises additional benefits for industrial segments such as Intra Data Center communication and Data Center Interconnects (DCI), Telecom, 5G and Automotive connectivity, High Performance Computing, LIDAR, Sensing and Medical

2019.09.18

eBooks 2019.09.09

Data Center Interconnect Trends

Data Center Interconnect Trends

Learn the top 3 trends of Data Center Interconnects and how Keysight solutions help to address your optical and photonic test challenges in the data center.

2019.09.09

Application Notes 2018.07.02

On-Wafer Testing of Opto-Electronic Components – Rev2

On-Wafer Testing of Opto-Electronic Components – Rev2

This paper explains the principles of on-wafer measurements on opto-electronic components using Keysight’s N437xB/C/D Lightwave Component Analyzers. Learn more.

2018.07.02

Application Notes 2018.08.29

Wafer and Chip-Level Optical Test

Wafer and Chip-Level Optical Test

The optical testing of wafer and chips for photonic integrated circuits requires attention to the polarization of input light. See how the N7700A supports this.

2018.08.29

White Papers 2019.05.01

Coherent Optical Transforms Data Center Interconnects

Coherent Optical Transforms Data Center Interconnects

Using coherent optics technology, DCIs can transport terabytes of information across a single fiber line and provide flexibility to address growing data demands.

2019.05.01

White Papers 2019.05.08

Integrated Photonics Transform Data Center Interconnects (DCI)

Integrated Photonics Transform Data Center Interconnects (DCI)

Integrated photonics offer a data center interconnect (DCI) solution to enable terabit-scale data traffic while reducing power consumption and costs.

2019.05.08

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