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Instrument Workflow Software

Integrated Photonics Test Products

Integrated photonics, often called silicon photonics, promises additional benefits for industrial segments such as intra data center communication, data center interconnections (DCI), telecom, 5G, automotive connectivity, high-performance computing, LIDAR, sensing, and medical

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Efficient Wafer level test

Higher data rates in data center infrastructure are driving tighter design margins and energy efficiency, accelerating the need for integrated photonics and multi-die designs. Photonic Integrated Circuits enable the co-packaging of optical and electrical components, creating new testing challenges that Keysight addresses with comprehensive silicon photonics wafer- and RF-test solutions.

Keysight provides complete test solutions for silicon photonics wafer test:

with wavelength and polarization-dependent measurements with a tunable laser source, polarization synthesizer, multiport power meter, and source measurement unit with application software
RF tests with Keysight lightwave component analyzer
Automated wafer probing with FormFactor probe station

High Speed Digital Design using ADS Software

RF and DC O/E and E/O Design Analysis

Keysight's solution portfolio comprises the complete toolset you need to do high-frequency O/E and E/O measurements up to 67 GHz and beyond:

Speed up with Test Automation

Keysight helps you reduce test time and cost with:

Test recipes, measurement plan definition and execution included in the KS8400A PathWave test automation platform (TAP)
Automated Photonic Application Suite with TAP plug-in
Automated wafer probe station control via N7700210C wafer prober plugin
Automated O/E and E/O lightwave component analyzer (LCA) measurement N4370P01A LCA TAP plug-in

One-Stop Wafer Production Test

Keysight also provides solutions for silicon photonics wafer manufacturing test using fully-automated wafer probers:

One-stop integrated solution
Automated one-pass testing
Ready for volume production
High-throughput testing
Guaranteed system performance
Dedicated support model

NX5402A Silicon Photonics Wafer Test System

Find The Model That's Right For You

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N4370P01A

N4370P01A LCA TAP Plug-In

Starting from

Simplifies automation of LCA RF/optical measurements with TAP.

N7700100C

N7700100C Polarization Lambda Scan Software License

Starting from

Enables polarization-dependent swept-wavelength multichannel measurements with the PAS LS engine and PAS IL/PDL engine, as well as measurements without varying polarization with the PAS LS engine and PAS FSIL engine.

N7700210C

N7700210C Wafer Prober TAP Plug-In

Starting from

Easily integrate wafer prober control within TAP test sequences for fully automated wafer and chip scale test solution for Integrated Photonics.

KS8400A

KS8400A PathWave Test Automation

Starting from

Test sequencer software with timing analyzer, result viewer, and other useful tools for test automation development.

N7700101C

N7700101C DWDM Channel Analysis Software License

Starting from

Enables analysis of insertion loss and polarization dependent loss spectra from PAS measurement engines to determine specification parameters for passband filter devices according to ITU-T definitions. Can also be applied to the 800 GHz LAN-WDM grid. Also determines polarization dependent frequency shift for filter passbands.

N7700103C

N7700103C PMD Lambda Scan Software License

Starting from

Enables swept-wavelength measurement of differential group delay (DGD) and polarization mode dispersion (PMD), as well as IL (also for TE/TM polarization) and PDL with the N7788C and the PAS LS engine.

N7700102C

N7700102C Fast Lambda Scan Software License

Starting from

Enables fast swept-wavelength multichannel measurements with the PAS LS engine and PAS FSIL engine.