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CMOS and HVMOS Modeling

Complete DC and RF modeling extraction packages for industry standards CMOS models.

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Significant process technology advances, including miniaturization of devices and introduction of new configurations and materials have led to a more diverse range of product applications for silicon devices. Beyond the traditional logic and memory applications, a number of new applications for CMOS technology are being developed. These include advanced applications such as high voltage devices for flat panel displays and high power devices for automotive systems.

IC-CAP is committed to making the MOS modeling engineer successful

IC-CAP’s open architecture and flexible software environment make adjustments in the extraction possible to meet diverse modeling requirements.
Keysight is committed to rapidly support new industry standard models.
Continuous technical and usability enhancements are being made to the programming environment and the user interface.
The following efficient, turnkey measurement and extraction applications are available.

Product Number	Model	Product Description
W8532EP	Root MOSFET, Diode and MOS	Automated modeling procedure for DC and RF 3-terminal applications using interpolative spline fitting of S-parameters and DC data arrays over the device's operating range. Also includes extraction for Root Diode and MOS models.
W8550EP	PSP	Complete measurement and extraction procedure for DC, CV & RF parameters. Includes Corner and Target Modeling Extraction Packages.
W8551EP	HiSIM2	Complete measurement and extraction procedure for DC, CV & RF parameters. Includes Corner and Target Modeling Extraction Packages.
W8552EP	BSIMSOI4	Complete measurement and extraction procedure for DC, CV & RF parameters. Includes Corner and Target Modeling Extraction Packages.
W8553EP	BSIM3	Complete measurement and extraction procedure for DC, CV & RF parameters. Includes Corner and Target Modeling Extraction Packages.
W8554EP	BSIM4	Complete measurement and extraction procedure for DC, CV & RF parameters. Includes Corner and Target Modeling Extraction Packages.
W8555EP	HiSIM_HV	Complete measurement and extraction procedure for DC, CV & RF parameters. Includes Corner and Target Modeling Extraction Packages.
W8560EP	HiSIM2 and HiSIM_HV	Includes extraction for both HiSIM2 and HiSIM_HV models in a conveniently priced package. This license behaves as a bundle license.