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Improve your i3070 in-circuit test system's test performance with advanced software that increases test throughput and coverage. Expand your testing capabilities and optimize your manufacturing process with these powerful tools.

Our software licenses include the following:

  • Advanced Throughput Multiplier, which can save up to 50% of test time.
  • Native testing software licenses for boundary scan-related tests that cover IEEE 1149.1 and 1149.6 standards.
  • Keysight's Cover Extend Technology (CET) for extending test coverage to non-boundary scan devices using nanoVTEP and CET Signal Conditioner Card.
  • Silicon Nails feature uses boundary scan device drivers and receivers to test non-boundary scan devices connected to the chain flashing test capability through Flash ISP and PLD ISP features.
  • DGN Advanced Reporting feature for diagnostic testing.
  • Yearly software updates for test development and runtime to keep your testing up-to-date.

Find the Model That's Right For You

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K8212A
K8212A 1149.1 Boundary Scan Feature, GTE 10.00p 
A partir de  
Boundary scan is a method for testing interconnections on printed circuit boards. Keysight’s Interconnect Plus Boundary Scan feature enables all the tools required to develop and execute this foundational test method on the board under test.
K8213A
K8213A 1149.6 Boundary Scan Feature, GTE 10.00p 
A partir de  
Keysight’s Interconnect Plus Boundary Scan 1149.6 feature enables all the tools required to develop and execute this test method on the board under test. Compared to the 1149.1 standards, the 1149.6 standards define test methods for the boundary scan devices that are designed with AC coupled signals or differential nets needed for high-speed operations of the device.
K8214A
K8214A Silicon Nails Feature, GTE 10.00p 
A partir de  
Keysight’s Silicon Nails feature enables all the tools required to develop and execute tests on non-compliant boundary scan devices that are connected to boundary scan compliant devices on the printed circuit board.
K8215A
K8215A Advanced Throughput Multiplier Feature, GTE 10.00p 
A partir de  
The Advanced Throughput Multiplier feature allows you to test up to two 1000 to 2000 node (between 1296 and 2592 nodes) boards simultaneously on a 4 module tester, thus dividing the test time by half.
K8217A
K8217A Cover Extend Feature, GTE 10.00p 
A partir de  
Cover-Extend Technology (CET) extends the Boundary Scan limited access solution on non-boundary scan devices with the use of VTEP or nanoVTEP and CET signal conditioner card hardware.
K8218A
K8218A Drive-Thru Feature, GTE 10.00p 
A partir de  
The DriveThru feature enables the test development software to test integrated circuits or connectors when there are no test points assigned between the resistor and the device.
K8219A
K8219A Flash ISP Feature, GTE 10.00p 
A partir de  
The Flash ISP feature enables in-system programming that is usually executed through a flash player application that drives the MCU to execute the programming onto the flash device.
K8220A
K8220A PLD ISP Feature, GTE 10.00p 
A partir de  
The PLD ISP feature allows the test developer engineer to specify a configuration bitstream file in VCL digital test file, much like programming a Flash memory device. The PLD ISP feature supports multiple PLD configuration data formats are supported including. Serial Vector Format (SVF), Standard Test And Programming Language (STAPL), Jam, Jam Byte Code (JBC) object files.
K8223A
K8223A DGN Advanced Reporting Feature, GTE 10.00p 
A partir de  
The Basic Diagnostics levels is the main troubleshooting tool used by all users to check the hardware configuration, and verify and isolate hardware failures. Some Diagnostic tests require that a Pin Verification Fixture be installed on the system.
K8224A
K8224A Software Update For Test Development, GTE 10.00p 
A partir de  
Software Update for test development is a service that allows the user to get the latest software revisions for their Keysight In-circuit Test Systems.
K8225A
K8225A Software Update For TestHead, GTE 10.00p 
A partir de  
Software Update for testhead is a service that allows the user to get the latest software revisions for their Keysight In-circuit Test Systems.
K8228A
K8228A Silicon Nails Feature Development and Runtime, GTE 10.00p 
A partir de  
The Silicon Nails test development tool also allows users to define the vectors that they would like to execute on the non-compliant boundary scan device. The test development tool will generate the boundary scan test to output or input at the relevant interconnecting pin, thus generating the test consistently.
K8212B
K8212B 1149.1 Boundary Scan Feature, GTE 10.00p 
A partir de  
Boundary scan is a method for testing interconnections on printed circuit boards. Keysight’s Interconnect Plus Boundary Scan feature enables all the tools required to develop and execute this foundational test method on the board under test.
K8213B
K8213B 1149.6 Boundary Scan Feature, GTE 10.00p 
A partir de  
Keysight’s Interconnect Plus Boundary Scan 1149.6 feature enables all the tools required to develop and execute this test method on the board under test. Compared to the 1149.1 standards, the 1149.6 standards define test methods for the boundary scan devices that are designed with AC coupled signals or differential nets needed for high-speed operations of the device.
K8214B
K8214B Silicon Nails Feature, GTE 10.00p 
A partir de  
Keysight’s Silicon Nails feature enables all the tools required to develop and execute tests on non-compliant boundary scan devices that are connected to boundary scan compliant devices on the printed circuit board.
K8215B
K8215B Advanced Throughput Multiplier Feature, GTE 10.00p 
A partir de  
The Advanced Throughput Multiplier feature allows you to test up to two 1000 to 2000 node (between 1296 and 2592 nodes) boards simultaneously on a 4 module tester, thus dividing the test time by half.
K8217B
K8217B Cover Extend Feature, GTE 10.00p 
A partir de  
Cover-Extend Technology (CET) extends the Boundary Scan limited access solution on non-boundary scan devices with the use of VTEP or nanoVTEP and CET signal conditioner card hardware.
K8218B
K8218B Drive-Thru Feature, GTE 10.00p 
A partir de  
The Drive Thru feature enables the test development software to test integrated circuits or connectors when there are no test points assigned between the resistor and the device.
K8219B
K8219B Flash ISP Feature, GTE 10.00p 
A partir de  
The Flash ISP feature enables in-system programming that is usually executed through a flash player application that drives the MCU to execute the programming onto the flash device.
K8220B
K8220B PLD ISP Feature, GTE 10.00p 
A partir de  
The PLD ISP feature allows the test developer engineer to specify a configuration bitstream file in VCL digital test file, much like programming a Flash memory device. The PLD ISP feature supports multiple PLD configuration data formats are supported including. Serial Vector Format (SVF), Standard Test And Programming Language (STAPL), Jam, Jam Byte Code (JBC) object files.
K8223B
K8223B DGN Advanced Reporting Feature, GTE 10.00p 
A partir de  
The Basic Diagnostics levels is the main troubleshooting tool used by all users to check the hardware configuration, and verify and isolate hardware failures. Some Diagnostic tests require that a Pin Verification Fixture be installed on the system.
K8228B
K8228B Silicon Nails Feature Development and Runtime, GTE 10.00p 
A partir de  
The Silicon Nails test development tool also allows users to define the vectors that they would like to execute on the non-compliant boundary scan device. The test development tool will generate the boundary scan test to output or input at the relevant interconnecting pin, thus generating the test consistently.
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