All Software Catalog

Combining test and measurement expertise with data science and big data engineering, the PathWave Manufacturing Analytics platform provides actionable insights for every level in your organization in the smart factory of the future. Improve yield, lower retest and handling, and lower the cost of poor quality with big data advanced analytics that really works. Accelerate your Return on Investment and business outcomes with unique, innovative analytics.

Descriptive

• View your factory performance in terms of Overall Operating Efficiency (OEE), yield, first pass yield, retest, volume, etc. with extensive drilldowns and filters
• Save the workspace and see your own personalized dashboard on demand, real-time from anywhere

Diagnostic

• Use no-code specially curated diagnostic tools and visualizations for all levels of operators, technicians and engineers
• Root cause issues with just a few clicks, compare between multiple tests, systems, fixtures, parts, probes and more

 Predictive

• Predict potential quality issues in real-time manufacturing with optimized machine learning anomaly detection models
• Get only “high severity scored” alerts. Take action to prevent catastrophe and mitigate the risks of poor quality without alert fatigue

Prescriptive

• Prescribe real-time adaptive test limits with optimized dynamic part averaging testing
• Leverage transformed data and insights for horizontal and vertical systems to optimize processes

The M6803B tool provides a powerful capability to test the functionality of embedded instruments within a semiconductor device without the need to define the instruments or their features. By adding the necessary ICL and PDL files as libraries and assigning them to the relevant devices, the tool can automatically generate tests for devices compliant with the IEEE 1687 standard.

The M6802B tool provides a powerful capability to test the functionality of embedded instruments within a semiconductor device without the need to define the instruments or their features. By adding the necessary ICL and PDL files as libraries and assigning them to the relevant devices, the tool can automatically generate tests for devices compliant with the IEEE 1687 standard.

Automate Testing with TestExec SL

• Intelligent architecture - supports C/C++, VB, C#, VB.NET, Keysight VEE, and more
• Switch Manager - streamlines the task of switching topology configuration
• Test Profiler - evaluates and optimizes the performance throughput of individual tests
• Throughput Multiplier - increases throughput through batch testing for multiple UUTs
• Reusable library - provides framework for code reuse (handlers, actions, and test sequences)
• Multithreading – executes multiple test statements simultaneously
• Asynchronous testing capabilities to better optimize test time and utilization

Keysight Technologies' TestExec SL is a customizable, flexible test executive developed specifically for electronics manufacturing functional test applications. This off-the-shelf test executive empowers test developers with a fully customizable operator interface, open architecture for multiple instrument integration, flexible test sequencing, easy debugging tools, and provisions for line integration in most manufacturing test environments. TestExec SL boosts productivity, offers unique advantages for test automation, and is unbeaten for ease of use.

Boundary scan is a method for testing interconnections on printed circuit boards. Keysight’s Silicon Nails feature enables all the tools required to develop and execute tests on non-compliant boundary scan devices that are connected to boundary scan compliant devices on the printed circuit board.

During test development, the Silicon Nails test development tool references the digital test defined for the non-compliant boundary scan device. Then, it will generate a boundary scan test that drives the boundary scan devices on the chain to execute the test vectors onto the non-compliant boundary scan device. So, the tester is driving the non-compliant boundary scan device and testing it through the boundary scan chain.

The Silicon Nails test development tool also allows users to define the vectors that they would like to execute on the non-compliant boundary scan device. The test development tool will generate the boundary scan test to output or input at the relevant interconnecting pin, thus generating the test consistently.

The i3070 In-Circuit Tester is equipped with comprehensive diagnostics software that enables users to easily troubleshoot the tester. The diagnostic software has two levels: basic and advanced.

The Basic Diagnostics level is the main troubleshooting tool used by all users to check the hardware configuration, verify and isolate hardware failures. Some diagnostic tests require that a Pin Verification Fixture be installed on the system.

The Advanced Diagnostics level is for trained users only. When a failure occurs during the diagnostics, additional steps are executed to test the relay performance and isolate the failing relay. This gives more fault descriptions to the user.

A Programmable Logic Device (PLD) is used by designers when they need to set or change the function of the device installed on the circuit board. These devices are usually used in the NPI stage of the circuit board. To set the function of the PLD, it needs to be programmed.

The PLD ISP feature allows the test developer engineer to specify a configuration bitstream file in a VCL digital test file, much like programming a Flash memory device. The PLD ISP feature supports multiple PLD configuration data formats, including:

• Serial Vector Format (SVF)
• Standard Test And Programming Language (STAPL)
• Jam
• Jam Byte Code (JBC) object files

Flash ISP is an optional software product that significantly improves flash programming speeds. It does so through the use of the Flash ISP algorithm and through the hardware functionality of the Control XTP card or newer.