How to Optimize VCSEL Pulse Performance

+ Modular PXIe Precision SMU

Optimize Narrow-Pulse VCSEL Performance

Vertical Cavity Surface Emitting Laser (VCSEL) pulsed testing requires controlling the current waveform delivered to the device under test (DUT). The actual output pulse can vary with DUT impedance, causing the measured waveform to differ from the programmed source settings. Pulse amplitude, rise time, settling behavior, and pulse shape therefore need to be evaluated at the connected device rather than inferred only from the configured source parameters.

The test applies a narrow current pulse while capturing the actual output waveform and adjusting the source parameters for the connected DUT. Engineers can compare pulse responses as the settings are tuned and verify that the resulting waveform provides the intended pulse amplitude and shape. This measurement process supports repeatable pulsed characterization across VCSEL devices with different impedance conditions.

Optimized VCSEL Pulse Performance Solution

Optimizing VCSEL pulse performance requires measuring the actual current waveform and adjusting source parameters for the impedance of the connected device. The Keysight Precision PXIe Source/Measure Unit (SMU) provides a tuning utility that adjusts SMU parameters for optimal pulse performance under different DUT impedance conditions. Because DUT impedance can alter the actual output pulse from the programmed settings, the embedded waveform measurement capability provides visibility into the delivered current waveform. The Keysight Precision PXIe Source/Measure Unit (SMU) also supports narrow-current-pulse sourcing down to 10 µs and embedded high-speed measurement up to 15 MSa/s, allowing pulse settings and resulting transient behavior to be evaluated within the same measurement platform.

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