- Overview
- All Models
- Support
Portable power for debugging complex digital systems
Keysight LA1-class portable logic analyzers deliver compact, high-performance digital signal analysis for debugging, verifying, and optimizing DDR and low-power DDR (LPDDR) memory systems. They feature high channel count, deep memory, fast timing speed, and the ability to view time-correlated oscilloscope results directly on the logic analyzer. Choose one of our popular configurations or configure one specific to your application.
High channel count
Simultaneously analyze multiple digital signals — ideal for monitoring interfaces with multiple signal lines, correlating signal activity across subsystems, and validating critical system timing.
Deep memory
Capture more data in a single acquisition — required for longer signal capture of high-speed systems with fast sampling rates and for analyzing complex or intermittent signals.
Fast timing speed
Capture digital signals with up to 5 GHz timing resolution to accurately detect short pulses, glitches, and timing anomalies — ideal for measuring critical signal relationships and diagnosing signal integrity issues.
Integrated scope view
Integrated, time-correlated oscilloscope waveforms displayed on the logic analyzer ensure accurate timing between analog and digital signals and enable signal integrity validation.
-
Number of channels
34 to 136
-
Maximum memory depth
128 Mpts
-
Standards
LPDDR4, LPDDR3, LPDDR2, LPDDR, DDR4, DDR3, DDR2, DDR
-
Signal type
Single-ended, differential
-
Maximum timing speed
5 GHz conventional / 12.5 GHz timing zoom
Most popular configurations
LA1-class Logic Analyzer
LA1-class Logic Analyzer
LA1-class Logic Analyzer
Services and support
Innovate at speed with curated support plans and prioritized response and turn-around times.
Get predictable, lease-based subscriptions and full lifecycle management solutions—so you reach your business goals faster.
Experience elevated service as a KeysightCare subscriber to get committed technical response and more.
Ensure your test system performs to specification and meets local and global standards.
Make measurements quickly with in-house, instructor-led training, and eLearning.
Download Keysight software or update your software to the newest version.
Frequently asked questions
Portable logic analyzers offer high-speed timing capture, deep memory, extensive channel support, and protocol decoding, making them ideal for on-the-go testing and debugging of digital systems. They provide real-time signal visualization, advanced triggering options, and compatibility with various communication protocols, allowing engineers to efficiently diagnose timing issues, signal integrity problems, and protocol violations in embedded systems and high-speed digital designs.
Portable logic analyzers are compact, self-contained units designed for fieldwork, troubleshooting, and use in space-constrained environments. They often feature built-in displays, standalone operation, and battery power for increased mobility. In contrast, modular logic analyzers offer greater flexibility and scalability, typically requiring a separate computer or mainframe for data analysis. Modular solutions are better suited for large-scale debugging, higher channel counts, and advanced applications requiring integration with oscilloscopes and other test instruments.
Synchronous (state) capture means that the measurement system in the logic analyzer determines the logic value of digital parallel buses or control lines when there is an associated valid clock, such as a rising edge on a probed system clock line. In contrast, asynchronous (timing) capture means that the measurement system samples the value of a bus or individual digital lines asynchronously from the system under test or not in sync with the system.
Using a portable logic analyzer for digital system debugging provides accurate and reliable measurements, comprehensive analysis tools, and the ability to capture and analyze multiple signals simultaneously. Key benefits include quick detection of timing errors, protocol violations, and logic state changes, enabling faster debugging and troubleshooting. Their compact design allows engineers to test systems in real-world environments, improving efficiency and reducing development time for embedded and high-speed digital applications.