WIN Semiconductors Connects GaN MMIC Design and Verification in a Unified Workflow
Case Studies
WIN Semiconductors and Keysight created a joint gallium nitride (GaN) monolithic microwave integrated circuit (MMIC) workflow linking on-chip simulation, 3D layout verification, and off-chip evaluation-board design.
WIN’s NP 120P GaN Process Design Kit (PDK) works with Keysight Advanced Design System (ADS) and RF Circuit Simulation Professional to automate simulation, optimization, and verification before foundry submission.
GaN MMIC design houses serve applications such as 5G base stations, Wi-Fi access points, satellite payloads, and defense radar systems. Before fabrication, engineers must complete the simulation, optimization, and verification steps needed to sign off a design.
A missed analysis can carry a high cost. A failed tapeout can mean weeks lost to another foundry respin. Design teams therefore need to verify the chip thoroughly before submission while keeping chip-level and evaluation-board design aligned.
That alignment matters after tapeout, too. MMIC customers will not commit to purchase until they can measure performance on a physical evaluation board containing the MMIC, packaging, PCB, and test connectors. WIN needed a workflow that brought those on-chip and off-chip elements together and helped designers prove full-system performance before fabrication.
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