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Parametric Test Solutions Wafer-level test systems for parametric validation
Model: NX6002A
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PX9002A Parallel Parametric Test System
The Keysight PX9002A Parallel Parametric Test System has a unique per-pin parametric test unit with a range of parametric test capabilities such as IV measurement, capacitance measurement, frequency measurement and pulsed measurement. It significantly improves throughput with its powerful per-pin test capabilities and strong parallelization function.
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Maximum number of measurement pins
50
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Minimum voltage measurement resolution
2 µV
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Additional features
SPGU output, CV measurement
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Minimum current measurement resolution
0.1 fA
Ready for a quote
Find out what's included and explore available upgrade options from Keysight.
Highlights
- Highest throughput parallel parametric test solution for a broad range of semiconductor manufactureres currently using Keysight 4080 series Parametric Test System
- 50-pin parallel test measurement capability with 100 V per-pin SMU
- True per-pin parametric test unit with various parametric test capabilities such as IV measurement, capacitance measurement, frequent measurement and pulsed measurement
- Easy migration from Keysight 4080 series environment
- Proven data correlation with Keysight 4080 series
Services and support
Innovate at speed with curated support plans and prioritized response and turn-around times.
Get predictable, lease-based subscriptions and full lifecycle management solutions—so you reach your business goals faster.
Experience elevated service as a KeysightCare subscriber to get committed technical response and more.
Ensure your test system performs to specification and meets local and global standards.
Make measurements quickly with in-house, instructor-led training, and eLearning.
Download Keysight software or update your software to the newest version.
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