Accessories

• Test and validate high-speed technologies such as DDR5 / MIPI with the 25 GHz probe amplifier (AP2).
• Experience the highest input impedance in midband frequencies for low-energy probing.
  
• Boost test margins with the lowest signal degradation.
• Probe small devices with the super-flexible micro probe head or choose from the widest variety of compatible probe heads for your unique application.
• Measure differential, single-ended, and common mode signals with a single probe tip.
  
• Use with Infiniium UXR-, 90000 X-, Q-, V-, and Z-Series oscilloscopes.

Keysight’s MX0025A InfiniiMax Ultra Series probe amplifier improves usability because you can measure differential, single-ended, and common mode signals with a single probe tip.

When you use a probe to connect your signal to your oscilloscope, it becomes part of the circuit affecting your test. Your probe may be hiding signal details, loading down your signal, or distorting it. InfiniiMax Ultra Series probes have the lowest loading for minimal impact to your circuit. Boost your test margins and gain measurement confidence with their unprecedented accuracy. Ensure your entire measurement system is helping you see the truest representation of your signal.

These probes have the lowest noise and capacitive loading and the lowest loading across more frequencies due to their RC high impedance profile. The InfiniiMax Ultra Series supports InfiniiMode and has a user-defined AC calibration mode, a wider input voltage range, more accuracy with unique S-parameter characterization, lower capacitive loading, a wider input voltage range, micro / socketed probe heads for smaller density probing, and more bandwidths. The InfiniiMax Ultra Series has an RC input impedance architecture with the lowest loading and least signal distortion across the widest frequency range.

InfiniiMax Ultra probes have three attenuation ranges — 1:1, 4:1, and 8:1 — giving you superior noise performance and large voltage ranges, all while maintaining maximum bandwidth. The input range automatically configures depending on the size of the input signal and vertical scale of your oscilloscope.

Choose from the three flexible input dynamic ranges from 600 mVpp at 1:1, 2.5 Vpp at 4:1, and 5 Vpp at 8:1. Clearly see and know when your design is satisfactory, keep up with standards, easily probe small devices, and reduce test complexity with the InfiniiMax Ultra Series probes.

The WJ1100A CipherJudge Key Intercept HW Kit is a pocket-sized device that physically connects to a mobile of interest, and functions as an add-on to the SJ001A WaveJudge Wireless Analyzer Toolset.

Key Features:

• Intercepts the messages between the ME (Mobile Equipment) and USIM (Universal Subscriber Identity Module)
  
• Allows the SJ001A WaveJudge Wireless Analyzer to uniquely identify a UE, and decode all messages between UE and the Base Station
• Enables engineers to benchmark network attach, debug handover issues and contribute to QoE analysis in deployed networks
• Diagnoses problems of a unique UE operating in a network serving hundreds of other users while encryption is enabled

The WJ1000A mmWaveJudge Remote Receiver is a palm-sized mmWave to IF (intermediate frequency) converter, that extends the SJ001A WaveJudge Wireless Analyzer 5G FR1 band coverage to 5G FR2 band.

Key Features:

• Works seamlessly with the WaveJudge Wireless Analyzer receiver modules
  
• Supports basic 2x2 MIMO or massive MIMO applications at mmWave bands
• mmWave input range: 24GHz to 30GHz band, and 27GHz to 42.5GHz band
• IF output range: 2.6GHz to 4.7GHz
• mmWave bandwidth: 800MHz
• Powered via USB-C connection to WaveJudge Wireless Analyzer receiver modules

Protecting chips against laser fault attacks is one of the main security challenges in the smart card industry. With the DS1101A Fault Injection Laser System, perform advanced laser fault attacks that meet the highest international standards to assess if a smart card is secured against laser attacks. The DS1101A offers a set of new features meeting the latest timing and power requests from fault injection experts around the world. The special set of lasers with dedicated optics and ultra-fast and flexible control create the ultimate fault injection test solution. Its integration with the Inspector software further ensures that automation and analysis are covered by extendible modules which are flexible and easy to use.

• Supports front- and back-side attacks
• Integration with Inspector’s software and fault analysis modules
• Zoomable camera for easy navigation and automated Z-axis
• Fast multi-time glitching and accurate digital scaling with fast and predictable response to trigger pulse
• Multi-spot and IR navigation upgrades available
• Automatic scanning of a chip’s surface with integrated motorized XYZ stage
• Camera inspection of laser spot and location on chip area
• High repetition accuracy on motorized axes
• SDK available for integration into custom setups

The DS1031A Hardware Crypto Training Target is a development board based on an ARM Cortex-M4F core working at a 168MHz clock speed. It has been physically modified and programmed to act as a training target for side channel analysis (SCA) and fault injection (FI) attacks. The source code and integrated development environment (IDE) provided with the target allow it to also be used for development and prototyping.

• Challenging training target for both passive SCA attacks like differential power analysis (DPA) and active FI attacks like differential fault analysis (DFA)
• Accurately models current 32-bit embedded devices; HW crypto is implemented similar to current devices 
• Stable behavior; robust against accidental permanent damage from FI
• Configurable countermeasures

The DS1220A Smartcard Power Tracer helps identify power-based attacks, including simple power analysis (SPA) and differential power analysis (DPA). Using low-noise and high-bandwidth analog components that are electrically isolated from a smartcard’s digital circuitry, the Smartcard Power Tracer provides output with an excellent signal-to-noise ratio for precise measurement of power consumption. The capacitors inside the DS1220A are pre-charged to power the smartcard during each measurement to avoid any external noise in the circuit and maintain stable smartcard voltage.

• High-quality power signal with configurable gain and offset
• Configurable card voltage
• Configurable delay before trigger pulse
• Internal and external clock
• Buffered soft clock signal for smartcard
• Compatible with the High Precision Electromagnetic Probe​ and Pattern Based Trigger Generator​
• Serial interface externally available (e.g. to monitor smart card I/O or to control embedded devices)

The DS1211A is a continuous-wave laser source with very precise power output. Use it for side-channel measurements based on failure analysis methodologies applied for side channel analysis.

• 1425 nm continuous-wave laser
• Single mode
• 500 mw
• Long-life laser diode for minimal aging 
• Choose from coarse to detailed chip surface scanning with a 100:1 spot size range 
• Use with DS1101A Fault Injection Laser System and DS1102A Dual Laser Fault Injection System
• Control optical power with DS1160A Smartcard Voltage and Clock Glitcher or DS1180A Glitch Pattern Generator

Generating a trigger pulse at the right point in time is essential in fault injection (FI) and side channel analysis (SCA) testing, but clock jitter and random program interrupts make this difficult, resulting in inaccurate timing.

The DS1002A Pattern Based Trigger Generator solves this problem by generating a trigger pulse after detecting a pattern in the EM signal of a chip. A special narrow band-pass filter enables pattern detection even in noisy signals.

The DS1210A is a continuous-wave laser source with very precise power output. Use it for side-channel measurements based on failure analysis methodologies applied for side channel analysis.

• 1310 nm continuous-wave laser
• Single mode
• 500 mw
• Long-life laser diode for minimal aging
• Choose from coarse to detailed chip surface scanning with a 100:1 spot size range
• Use with DS1101A Fault Injection Laser System and DS1102A Dual Laser Fault Injection System
• Control optical power with DS1160A Smartcard Voltage and Clock Glitcher or DS1180A Glitch Pattern Generator

The Keysight E7770A common interface unit (CIU) provides a bidirectional intermediate frequency (IF) interface to the device under test (DUT) by up- or down-converting a sub-6 GHz uplink or downlink RF signal into a 6 to 12 GHz, or 7.7 to 14.5 GHz IF signal. This solution gives you the control, power, and local oscillator frequency input to the Keysight M1740A millimeter-wave (mmWave) transceiver for 5G remote radio heads (RRHs). As an up/down converter and RRH controller, the CIU supports the extension of the frequency coverage from sub-6 GHz to a high IF and mmWave bands.

The CIU is a key component of a wide range Keysight 5G solutions. These solutions provide the stimulus and analysis capabilities necessary to verify transceiver (Tx) and receiver (Rx) performance for 5G chipsets, devices, and base stations.

Quickly validate DUT performance over-the-air (OTA) with chambers designed for different test cases across the device workflow.

The F9681A manufacturing chamber is a compact solution for testing 5G mmWave devices when combined with a Keysight test set such as the E6681A EXM WB or the E7515E UXM 5G. Sized to fit in a rack or on a bench, the chamber is useful for repair, production, and bench-top testing.

Test each device antenna using up to four horn antennas pre-installed on the top, sides, and back of the chamber. Choose orthogonally-polarized dual horn antennas or circularly-polarized horn antennas. Adjust the positions of the horn antennas within the chamber to align with the device antennas using the supplied adjustment tool.

Simplify solution configuration with integrated switches verifying the behavior of every device antenna over the air without the need for re-connections. Automation is quick and easy with control through Ethernet for the pneumatic door and integrated mmWave switches.

The DS1112A 1064 nm Multimode Fault Injection Laser uses multimode laser diodes with a high power rating, enabling coarse chip surface scanning with large spot size and sufficient intensity within spot.

• 1064 nm wavelength NIR laser
• Laser pulse power: 30 W
• Configurable pulse length as small as 2 ns
• High pulse frequency allows multi-pulse fault injection attacks
• Short delay between trigger pulse and actual light pulse in combination with minimal jitter allows for accurate laser pulse timing
• Wide range of spot size: Choose from coarse to detailed chip surface scanning with objectives and spot size reducer
• Long-life laser diode with minimal aging
• Integrates with Keysight products DS1101A, DS1102A, DS1160A, and DS1180A