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The D9050CEIC application is a Keysight UXR oscilloscope-based conformance test automation package for physical layer electrical validation and debug of CEI-112G-PAM4 designs. It offers robust testing capabilities for extra short reach(XSR),very short reach(VSR) ,medium reach (MR) and long reach (LR) applications, making it an essential tool for engineers and technicians working in the field of high-speed data transmission. The application simplifies the testing process by automating various tasks, thereby enhancing productivity and reducing time to market.

Comprehensive measurement and debug solution

• Characterizes 112Gbps OIF-CEI  XSR, VSR, MR and LR reaches of the Common Electrical Interface specification.
• Nearly 100 automated electrical compliance tests

Key features

• Reduce time spent understanding the details of standards.
• Decrease the time it takes to characterize your PAM4 design from hours to minutes.
• Enable the debugging of your device using custom configurations.
• Generate HTML reports that summarize the performance of your device quickly.

Compatible

• UXR product series operating at and above 65 GHz.

The D9020FECP software package allows your UXR-Series oscilloscope to utilize the N4891A 400GBase FEC-Aware Receiver Test solution to trigger on and investigate burst errors leading to frame loss.

The D9020FECP FEC (KP4) 400GE Decode/Trigger software package with the Infiniium UXR-Series oscilloscope makes it easy to debug and test designs by:

• Identifying FEC errors in 400G optical waveforms on the oscilloscope.
• Working with N7004/5A O/Es to capture 50/100G (26/53GBd PAM4) optical lanes on 1 to 4 channels.
• Taking triggers from N4891A/A400GE to capture infrequent bursts of errors.
• Importing 50G PAM4 symbols near the trigger from N4891A/A400GE over LAN.
• Aligning both FEC-expected and Trigger electrical PAM4 symbols from N4891A/A400GE with 50G or 100G optical PAM4 symbols recovered from the acquired optical waveform.
• Color coding and searching for errors, either transmitter errors (waveform symbols do not match FEC-expected symbols) or receiver errors (where trigger symbols from the N4891A/A400GE do not match the FEC-expected signals).
• Allowing users to modify PAM4 optical clock recovery, equalization, and thresholds to see if errors can be eliminated on the captured symbols.
• Enabling users to quickly identify if errors are at the electrical or optical level.

Additional Features:

• Supports Transmitter Testing under the PCIe® 7.0 BASE specification at 128, 64, 32, 16, 8, 5, and 2.5 GT/s
• Supports Transmitter Testing under the PCIe® 6.0 BASE specification at 64, 32, 16, 8, 5, and 2.5 GT/s
• Supports Transmitter Testing under the PCIe® 6.0 CEM specification for 64, 32, 15, 8, 5, and 2.5 GT/s
• PCIe 7.0 BASE TX measurements including SNDR4, RLM4, uncorrelated TJ, uncorrelated DJ, uncorrelated PWJ, pseudo package loss and other parameters defined in the PCI Express BASE specification
• PCIe 6.0 BASE TX measurements including SNDR4, RLM4, uncorrelated TJ, uncorrelated DJ, uncorrelated PWJ, pseudo package loss and other parameters defined in the PCI Express BASE specification
• PCIe 6.0 CEM TX measurements including the Sigtest/Seasim signal quality, eye diagram test and CEM reference clock tests including noise waveform capture for oscilloscope noise compensation
• Four-level noise compensation available for PAM-4 SNDR and Jitter measurements
• PCI 7.0 reference clock measurements as defined in the PCIe 7.0 BASE specifications
• PCI 6.0 reference clock measurements as defined in the PCIe 6.0 BASE specifications
• Supports both real-time data capture as well as off-line analysis of previously captured waveforms
• Test setup wizard for ease-of-use
• Pass/fail margin analysis
• Support for both full-swing and low-power, half-swing devices
• Supported on UXR Series real time oscilloscopes having a minimum bandwidth of 50 GHz for PCIe 6.0 BASE measurements

• D9040PCIC - PCI Express Electrical Performance Validation and Compliance Software
• D9050PCIC - PCI Express 5.0 Transmitter Electrical Performance Validation and Compliance Software
  • Supports Transmitter Testing under the PCIe® 7.0 BASE specification at 128, 64, 32, 16, 8, 5, and 2.5 GT/s
  • Supports Transmitter Testing under the PCIe® 6.0 BASE specification at 64, 32, 16, 8, 5, and 2.5 GT/s
  • Supports Transmitter Testing under the PCIe® 6.0 CEM specification for 64, 32, 15, 8, 5, and 2.5 GT/s
  • PCIe 7.0 BASE TX measurements including SNDR4, RLM4, uncorrelated TJ, uncorrelated DJ, uncorrelated PWJ, pseudo package loss and other parameters defined in the PCI Express BASE specification
  • PCIe 6.0 BASE TX measurements including SNDR4, RLM4, uncorrelated TJ, uncorrelated DJ, uncorrelated PWJ, pseudo package loss and other parameters defined in the PCI Express BASE specification
  • PCIe 6.0 CEM TX measurements including the Sigtest/Seasim signal quality, eye diagram test and CEM reference clock tests including noise waveform capture for oscilloscope noise compensation
  • Four-level noise compensation available for PAM-4 SNDR and Jitter measurements
  • PCI 7.0 reference clock measurements as defined in the PCIe 7.0 BASE specification
  • PCI 6.0 reference clock measurements as defined in the PCIe 6.0 BASE specification
  • Supports both real-time data capture as well as off-line analysis of previously captured waveforms
  • Test setup wizard for ease-of-use
  • Pass/fail margin analysis
  • Support for both full-swing and low-power, half-swing devices
  • Supported on UXR Series real time oscilloscopes having a minimum bandwidth of 50 GHz for PCIe 6.0 BASE measurements

Comprehensive Compliance and Debug Solution

• Addresses 40GBASE-CR4 (802.3ba) and 100GBASE-CR10 (802.3ba)
• Measures ~60 parameters
• Has convenient utilities to de-skew cables

Flexible and Extensible

• Operate on an N1000A/86100D DCA-X oscilloscope, or on a PC connected to an N109x DCA-M via USB
• Control device under test and other equipment
• Test all or selected parameters to compliance limits or custom limits for development

Time-Saving Features

• Complete your additional extensive development testing using Debug mode
• De-skew measurement channel skew
• Control device under test
• Interface with other equipment

Compatibility

• N1000A/86100D DCA-X Mainframe
• N109X DCA-M Oscilloscope
• N107X Clock Recovery

Reduce your test time from hours to minutes. Use the N1091BACA Electrical TX Test software to measure your high speed serial host board, module or IC to all required transmit parameters in two IEEE 802.3ba standards.

Keysight offers a wide range of electrical and optical test solutions to address current and emerging communications standards. For testing IEEE 802.3 designs you may choose a hardware combination that addresses your test needs for today, and into the future:

1. N1000A/86100D DCA-X with N1060A/86108B (Integrated “One-Box” solution) - recommended
2. N1000A/86100D DCA-X with DCA module and external clock recovery
3. N109X Electrical DCA-M with external clock recovery

About 60 Tests

• Signaling rate
• Rise and fall times
• Differential and common mode amplitudes
• VMA
• Eye mask
• De-emphasis
• Output noise
• Transmitted waveform
• Jitter: J2, J9, DJ and TJ
• DDPWS
• Qsq
• Differential and common mode return losses

Product definition wizard

• Select the number of link rates and the bit rate values
• Select the number of levels used and the nominal value of levels you want
• Select the number of pre-emphasis settings and nominal pre-emphasis

Create your own test limits

• Enter limits that make sense for your design
• Define relative or absolute specifications for level or pre-emphasis
• Create your own jitter specifications for RJ, TJ, DJ and create your own eye masks for each bit rate

Specify your Test Plan

• Use test plan 'drop down' for each test type to determine conditions to validate or characterize
• Specify pattern you want to use for each test

Productivity through templates

• Define templates for product type and capability so subsequent runs require no setup
• Share template to facilitate identical testing in other locations

Meeting the complex requirements of eDP1.4:
The Keysight eDP Electrical Performance and Characterization Toolset is an industry-first test software package in enabling the creation of a test process tailored to the needs of a specific product, company work environment, and supply chain where there is a desire to have common test processes. eDP1.4 allows for arbitrary data rates, levels, pre-emphasis settings, channel models, and specifications which is difficult to handle using typical compliance software approach. The toolset not only allows for the arbitrary conditions but arbitrary test limits as well and enables level measurements to be measured relative to a previous state or in absolute terms.

Template driven test:
This software toolset builds on the highly successful DisplayPort compliance software (D9040DPPC) and extends the concept with an approach called ‘template driven test.’ A template can be created for local testing to facilitate numerous products of the same type and validation/characterization goals or can be shared with colleagues, vendors, or customers to ensure consistency of results throughout the supply chain.

Complete test list:
The Keysight eDP EP & C software toolset features a complete list of tests such as eye diagram, level validation, preemphasis measurement, spread spectrum clocking suite, and jitter to meet all your test needs. In addition, since it is built in the Infiniium test framework, you can add your own tests if needed through the add-in capability in the user-defined application tool.

• The fastest throughput oscilloscope solution for triggering on and analyzing I²C, SPI, UART, and RS232/422/485 serial buses
• Multiple bus decode triggering and listing display
• On-screen serial decode time-correlated with the serial data waveforms
• This package enables I²C, SPI, UART, RS232/422/485, and USB-PD serial trigger and decode, mask testing, frequency response analysis (Bode plotting), and enhanced HDTV video testing. Advanced math already comes standard on all P924xA Keysight Streamline Series USB oscilloscopes

The embedded software package for the P924xA Keysight Streamline Series USB oscilloscopes enables protocol triggering and decode for a broad range of the most common serial buses used today for embedded and mixed-signal designs. This package also enables other advanced analysis capabilities including mask testing and frequency response analysis to help test today’s electronic designs.

• The fastest throughput oscilloscope solution for triggering on and analyzing I²C, SPI, UART, and RS232/422/485 serial busses
• On-screen serial decode time-correlated with the serial data waveforms
• This package enables I²C, SPI, UART, RS232/422/485, and USB-PD serial trigger and decode, mask testing, frequency response analysis (bode plot), and enhanced HDTV video testing. Advanced math already comes standard on all M924xA PXIe modular oscilloscopes

The embedded software package for the M924xA PXIe modular oscilloscopes enables protocol triggering and decode for a broad range of the most common serial buses used today for embedded and mixed-signal designs. This package also enables other advanced analysis capabilities including mask testing and frequency response analysis to help test today’s electronic designs.

• The fastest throughput oscilloscope solution for triggering on and analyzing I²C, SPI, RS232/422/485/UART, I²S, and USB PD serial buses
• Multiple Bus decode triggering and listing display
• Perform 2-wire, 3-wire and 4-wire SPI serial protocol trigger and analysis
• On-screen serial decode time-correlated with the serial data waveforms
• This package enables I²C, SPI, RS232/422/485/UART, I²S, and USB-PD serial trigger and decode, mask limit testing, frequency response analysis (Bode plot), and enhanced HDTV video testing. Advanced math already comes standard on all 6000 X-Series oscilloscopes

The embedded software package for Keysight’s InfiniiVision 6000 X-Series oscilloscopes enables protocol triggering and decode for a broad range of the most common serial buses used today for embedded and mixed-signal designs. This package also enables other advanced analysis capabilities including mask testing and frequency response analysis to help test today’s electronic designs.