Spurious Emission Measurements Using Fast-Sweep Techniques
애플리케이션 노트
Measurement speed is a major issue for a wide variety of RF and microwave products, and this influencesproduction costs in industries ranging from commercial wireless to aerospace and defense. As a result,manufacturers in these areas are looking for ways to shorten design cycles, reduce manufacturing costs and increase yield. One important opportunity for improvement is the search for spurious emissions.