Measuring BTS Components Quickly and Accurately
애플리케이션 노트
With its improvements in peak data rates, spectral efficiency, and latency, the 3GPP Long Term Evolution (LTE) standard is a significant step forward in wireless performance. Not surprisingly, though, these higher levels of performance introduce a multitude of design and test challenges. Fortunately, a new generation of test equipment provides the capabilities needed to verify LTE performance quickly and easily. Here is a brief look at two of these methods, direct receiver access and receiver leveling.
Quickly measuring high-performance passive devices using direct receiver access
A good example of the more demanding test requirements in LTE is the need to verify extremely high rejection rates—on the order of 110 dB—in filters and other passive components. Ideally, you would use a network analyzer with at least 120 dB of dynamic range. Many conventional VNAs can deliver sufficient dynamic range, but their measurement speeds are too low to support the needs of high-volume manufacturing.