Electronic Components Semiconductor/Transistor Evaluation
전단지
IC - IV characteristics, leakage current test
- B1500A Semiconductor Device Analyzer
- E5270B 8-Slot Precision Measurement Mainframe
- B2900A Series Benchtop Source/ Measure Unit
Solar cell-CV characteristic test
- B1500A Semiconductor Device Analyzer
- E4980A Precision LCR Meter
- 4294A Precision Impedance Analyzer
MEMS-Pulsed IV test
- B1542A 10 n second Pulsed IV Parametric Test Solution
- B1500A Semiconductor Device Analyze
Nanotechnology-Noise evaluation, transient response evaluation
- B1500A Semiconductor Device Analyzer
- Used in combination with the B1530A Waveform Generator/Fast Measurement Unit Module, the B1500A is capable of RTN measurement.
Power device-Evaluation of break down voltage, on-resistance measurement
- B1505A Power Device Analyzer/ Curve Tracer
- N1259A/N1265A High Power Test Fixture for the B1505A