In-Fixture Characterization using RF Network Analyzers
Publication Number: 5988-6522EN
Publication Date: 2014.07.31
Language: English
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In-Fixture Characterization using RF Network Analyzers

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Many different techniques have been developed for eliminating the influence of test fixtures from measurement results. These can be classified into two fundamental approaches. One is performing calibration at the tips of a test fixture’s electrodes and the other is de-embedding characterized test fixture models. The first method requires customized calibration standards for each test fixture, which are very expensive and inflexible. On the other hand, de-embedding uses a model of the test fixture to mathematically remove unwanted test fixture effects from the overall measurement results. Usually, deembedding data can be obtained from the simulation results of the test fixture model, which is modeled with simulation tools such as the Keysight Technologies, Inc. Advanced Design System (ADS); however, accurate test fixture modeling is difficult and time-consuming. Therefore, engineers have been seeking an easy and accurate in-fixture characterization method.