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        3D Interconnect Designer

        3D Interconnect Designer provides a flexible modeling and optimization environment for any advanced interconnect structure, including chiplets, stacked die, packages, and PCBs.

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        Comprehensive design for advanced packages and 3DIC in any workflow
      • Oscilloscopes right arrow Sampling Oscilloscopes right arrow Digital Multimeters right arrow BERTS, Digitizers, and DAQs right arrow Digital Protocol Analyzers right arrow Waveform and Function Generators right arrow
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        AC Power Supplies right arrow DC Power Supplies right arrow DC Electronic Loads right arrow Power Analyzers right arrow Source Measure Units right arrow
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        Save up to 50% on an XR8 Oscilloscope

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      • Ethernet Traffic Emulation right arrow Network Emulators right arrow Interconnect Test right arrow
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        Introducing AI-Enhanced Packet Brokers

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        Vision 400 Network Packet Broker
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      Stream 120 MHz I/Q Data to Your Laptop in the Field

      Pinpoint interference with post-processing spectrum management software in the lab.

      Meet the New FieldFox
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      Find the Right ATE Power Solution

      Use this selector tool to quickly identify the best power supply for your aerospace and defense ATE requirements.

      Start Now
      Aerospace and Defense ATE Power Selector
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    Demos

    Validating Next-Gen Memory for AI Workloads

    Validating Next-Gen Memory for AI Workloads
    Show Description

    As artificial intelligence workloads continue to scale in complexity and performance, memory subsystems have become a critical bottleneck in system design. High‑bandwidth, low‑latency memory is essential to keep advanced processors and accelerators operating at full efficiency. Validating next‑generation memory interfaces therefore requires measurement solutions that can handle higher data rates, new signaling schemes, and increasingly tight signal integrity margins.

     

    This video presents practical examples of how next‑generation memory designs can be efficiently validated using a high‑performance real‑time oscilloscope and purpose‑built compliance and characterization tools. The focus is on three key memory technologies that are central to modern AI systems: GDDR7, DDR5, and HBM4. Together, these interfaces address different tiers of the memory hierarchy, from high‑speed graphics memory to main system memory and ultra‑high‑bandwidth stacked memory used in advanced AI accelerators.

     

    The first example highlights compliance testing for GDDR7, a next‑generation graphics memory interface designed to deliver higher data rates while improving power efficiency. GDDR7 introduces PAM3 signaling, a significant departure from traditional NRZ‑based memory interfaces. While PAM3 enables higher throughput, it also introduces new challenges related to signal‑to‑noise ratio and distortion, requiring more advanced measurement techniques. To address this, the validation workflow includes a dedicated GDDR7 compliance test application that incorporates both traditional measurements—such as eye diagrams, jitter, and timing analysis—and newer metrics tailored for PAM signaling.

     

    One of the key additions demonstrated is a signal‑to‑noise and distortion ratio (SNDR) measurement. SNDR provides deeper insight into the quality of multi‑level signaling by capturing both noise and nonlinear distortion effects that can degrade system performance. By combining SNDR with conventional eye and jitter measurements, engineers gain a more complete picture of link quality and can better assess design margin under real operating conditions. This is particularly important in AI workloads, where memory errors or marginal links can have outsized impacts on system stability and throughput.

     

    The second example focuses on DDR5 validation, showcasing measurements of data, strobe, clock, and other input/output signals. DDR5 continues to push memory speeds higher while increasing channel count and complexity. Accurate signal integrity measurements are essential to ensure reliable operation across all lanes. The setup demonstrated emphasizes the ability to quickly visualize eye diagrams and evaluate timing relationships between signals, allowing engineers to identify potential issues early in the design and validation cycle.

     

    A critical enabler across both GDDR7 and DDR5 use cases is the low intrinsic noise and fast response of the oscilloscope. Lower noise performance is especially important for memory applications, where de‑embedding of fixtures and interconnects is often required to reveal the true behavior of the device under test. Faster response time further enables rapid acquisition and analysis, reducing test time while preserving accuracy and measurement margin. Together, these characteristics allow engineers to complete validation tasks more efficiently without sacrificing confidence in the results.

     

    The final example presented in the video demonstrates characterization of an HBM4 test board. High Bandwidth Memory is a cornerstone technology for AI accelerators, offering massive parallelism and extremely high aggregate bandwidth through 3D stacking and wide interfaces. In this demonstration, the HBM4 test board is operating at 14 gigabits per second and is overclocked beyond standard operating speeds. Observing a wide‑open eye with substantial margin under these conditions provides strong visual confirmation of signal integrity and design robustness.

     

    This capability makes early HBM4 characterization significantly easier, even at aggressive data rates. For AI systems that rely on stacked memory to feed data‑hungry compute engines, early insight into margin and performance is invaluable. It allows design teams to optimize layouts, packaging, and signaling strategies before committing to production, reducing risk and accelerating time to deployment.

     

    In summary, this video illustrates how advanced oscilloscopes and memory‑specific validation software enable fast, accurate, and comprehensive testing of next‑generation memory interfaces. By supporting emerging signaling schemes such as PAM3 and delivering low‑noise, high‑fidelity measurements, these solutions help engineers validate GDDR7, DDR5, and HBM4 designs with confidence. As AI workloads continue to demand more from memory subsystems, efficient and reliable validation becomes a foundational requirement for successful system development.

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