PXI and AXIe Products and Solutions Catalog - September 2020

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PXI and AXIe Products and Solutions Catalog

Unlocking Measurement Insights

For more than 75 years, Keysight Technologies, Inc. has been unlocking measurement insights. Along the way, we’ve created industry-leading test equipment in the shapes and sizes you’ve asked for: full-size benchtop, small benchtop, handheld and modular. Our goal is to integrate our measurement expertise across multiple test platforms so that your teams will stay on the leading edge in your industry.

For modular instruments, our hardware innovations are focused on two specific forms: PXI and AXIe. We’re putting our unrivaled performance—and consistent measurement science—into the RF, microwave and high-speed digital instruments in our PXI and AXIe portfolio.

To provide time-saving starting points for test system creation, we’re documenting Reference Solutions that address specific application areas that range from power amplifier testing to satellite signal monitoring.

Software is an essential element of any test system—and Keysight software is downloadable expertise. From prototyping to simulation to manufacturing, we deliver the tools your team needs to accelerate from data to information to actionable insight. We also provide soft front panels and essential utilities that make our modular products usable within minutes out of the box, ensuring rapid time to first measurement.

Keysight has the industry’s largest network of experienced local application engineers covering RF, microwave and digital—and no one can match their cumulative years of experience.

Our uptime services ensure the ongoing accuracy, performance and availability of your instruments. We can create a customized service plan with response times as fast as four hours. Our network of over 50 service locations worldwide and mobile calibration teams, provide greater convenience and flexibility to keep your products and test systems operating to warranted specifications.

Keysight’s modular solutions help you tackle your toughest RF, microwave and digital challenges by delivering unrivaled PXI and AXIe performance. Our foundation is the industry’s most accurate measurement science, giving you maximum confidence to achieve your first, best measurement and insight into what’s next.

TEST CHALLENGE: REDUCING SIZE OF TEST SYSTEMS

More Test in Less Space: Driving Down the Size of Test

As silicon wafers, wireless devices and military systems have increased in complexity, multi-port vector network analysis with S-parameters has become an indispensable tool. A few years ago, vector network analysis with 4-port capability was a common need. A variety of next-generation products then entered the market, requiring 8-port measurements, and some manufacturers responded. The trend continued with the following generation requiring 16-port capability, and 32-port requirements in the near future.

A three-part test challenge: Reducing the size of VNA test systems while increasing capacity and capability

Along with this trend, many organizations are seeking to drive down the size of test with more capability per cubic inch in their test stations. This is a subset of the larger need to drive down the cost of test to help ensure ongoing profitability as prices erode in wireless communications or as business models change in aerospace and defense.

These long-term trends highlight three specific needs:

  • The need to test highly complex devices in much less time without sacrificing accuracy
  • The need to test multiple devices— and test in greater numbers—at a single test station
  • The need to reduce the size of the test stations used to test multiple wafer sites or complex devices

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