Test-System Development Guide: Maximizing System Throughput
アプリケーションノート
This application note is part of the Test-System Development Guide series, which is designed to help you quickly design a test system that produces reliable results, meets your throughput requirements, and does so within your budget.
This application note discusses hardware and software design decisions that affect throughput, including instrument and switch selection, as well as test-plan optimization and I/O and data transfer issues. We also discuss ways to optimize your system as you prepare to deploy it.