How to Perform Low-Power IC IV Characterization

Get Quote
Modular Source Measure Unit
+ Modular Source Measure Unit
Modular Source Measure Unit
+ Modular Source Measure Unit

Low-Power Integrated Circuit (IC) IV Testing

Low-power IC characterization requires measuring current versus voltage behavior across multiple operating states, including sleep, standby, and active modes. The test setup typically includes a source measure unit (SMU) configured to source voltage or current while simultaneously measuring response signals across multiple device nodes. Measurements must capture both static DC conditions and dynamic transitions with sufficient resolution and timing accuracy.

The measurement process involves applying controlled bias conditions, monitoring current consumption across different states, and capturing transient behavior during state transitions such as power-on or wake-up events. Multi-channel synchronization and trigger control enable coordinated measurements across multiple pins of the device under test (DUT). Data acquisition systems collect voltage and current waveforms for analysis, supporting validation of device performance under real operating conditions.

Low-Power Integrated Circuit (IC) IV Test Solution

Low-power IC IV characterization requires precise sourcing and measurement capabilities combined with synchronized multi-channel operation and high-speed data capture. This solution uses a high-channel-density SMU platform that integrates voltage and current sourcing, measurement, pulsing, and digitizing functions into a single system. It enables both static and dynamic IV characterization across multiple operating states. The system supports high channel density with up to 20 SMU channels in a compact footprint, reducing test complexity and equipment requirements. It provides wide dynamic range measurement from ultra-low currents to high transient currents and supports fast sampling rates for capturing transient behavior. Integrated trigger systems enable precise synchronization across channels and external equipment, allowing accurate characterization of complex low-power IC behavior.
Get Quote

See Block Diagram of Low-Power Integrated Circuit IV Test Solution

How to Perform Low-Power IC IV Characterization

Explore Products in Our Low-Power IC IV Test Solution

Related Use Cases

How to Measure Insulating Material Resistivity

Measure surface and volume resistivity of insulating materials with high accuracy using electrometers and resistivity cells.

Learn More

How to Design and Optimize FET Amplifiers

Design and optimize FET amplifiers using simulation and measurement workflows for accurate RF performance validation.

Learn More

How to Characterize Bipolar Transistor IV Curves

Characterize BJT current-voltage behavior using synchronized dual-channel SMU measurements for accurate device analysis.

Learn More

contact us logo

Get in Touch with One of Our Experts

Need help finding the right solution for you?

Contact Us