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Compact, multichannel vector signal generator capable of signal generation up to 8.5 GHz with 1 GHz of modulation bandwidth per channel.
Enable faster, flexible testing for 802.3ck and PCIe® 6.0 designs with a 50+ GHz probe.
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This course discusses the use of waveform analytics to analyze IoT devices providing detailed explanations.
Learn:
Lesson 1 - Key Challenges that Impact IoT Product Reliability
Discusses the three key challenges that impact IoT product reliability: the increasing complexity of IoT devices, the increasing number of IoT devices, and the harsh environments in which IoT devices are often deployed.
Lesson 2 - Keysight Solutions - CX3300A and Anomalous Waveform Analytics
Introduces the Keysight CX3300A Device Current Waveform Analyzer and the Anomalous Waveform Analytics software. These tools can be used to analyze large data sets of current waveforms to identify anomalous waveforms that may indicate a hardware failure.
Lesson 3 - Efficient Analysis of Large Data Sets
Discusses the challenges of analyzing large data sets of current waveforms. The Anomalous Waveform Analytics software can be used to efficiently analyze these data sets by identifying anomalous waveforms and then focusing further analysis on those waveforms.
Lesson 4 - Demo: Anomalous Waveform Analytics
Provides a demonstration of the Anomalous Waveform Analytics software to show how the software can be used to analyze a data set of current waveforms and identify anomalous waveforms.
Lesson 5 - Application Examples of Anomalous Waveform Analytics and Summary
Provides some application examples of the Anomalous Waveform Analytics software to show how the software can be used to identify anomalous waveforms in a variety of IoT devices.
hardware
CX3324A Device Current Waveform Analyzer, 1 GSa/s, 14/16-bit, 4 Channel
CX3324A is a 4-channel mainframe with up to 16-bit wide resolution. The memory depth and the bandwidth are upgradable up to 256 MSa/s and 200 MHz respectively.
How to Test Wide-Bandgap Semiconductor Power Modules
Characterize WBG semiconductor power modules using a double-pulse testing system and pulse-isolated probe
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