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Simplifies automation of LCA RF/optical measurements with TAP
Simplifies automation of LCA RF/optical measurements with TAP
N4370P01A
Simplifies automation of LCA RF/optical measurements with TAP
Keysight Test Automation on PathWave (TAP) is a modern Microsoft .NET-based application for standalone use or in combination with higher level test executive software environments. Instrument plug-ins provide test steps that can be added to work-flow sequences without instrument level programming commands. The LCA plug-in steps further simplify automation by handling the interface to both the PNA instrument and the LCA optical hardware and software and providing the test steps for easy configuration.
Use the proven analysis software from Keysight’s optical modulation analyzer portfolio on your PC for deeper analysis of recorded data.
Use the proven analysis software from Keysight’s optical modulation analyzer portfolio on your PC for deeper analysis of recorded data.
N4391SALC
Use the proven analysis software from Keysight’s optical modulation analyzer portfolio on your PC for deeper analysis of recorded data.
Analyze complex modulated optical signals with this software, either as a standalone software installation or in combination with a Keysight oscilloscope.
The analysis software from Keysight’s optical modulation analyzer (OMA) portfolio can be used on your PC without any instrumentation. It offers analysis capabilities such as advanced signal processing algorithms for complex modulated optical signals.
Use this software to process and analyze raw data stored as .sdf, .mat, or .csv files from measurements with any Keysight OMA This capability allows you to work with the data as if you were working directly in front of the instrument. Develop your own signal processing algorithms and test them offline, together with your MATLAB compiler. In addition, this software is an effective tool for learning basic and advanced concepts of complex optical modulation, based on stored files.
Benefits of a standalone software installation include the following:
Benefits of the scope hardware connection include the following:
For other related products, please see the basic photonics portfolio and UXR-Series oscilloscopes.
Easily integrate wafer prober control within TAP test sequences for fully automated wafer and chip scale test solution for Integrated Photonics.
Easily integrate wafer prober control within TAP test sequences for fully automated wafer and chip scale test solution for Integrated Photonics.
N7700210C
Easily integrate wafer prober control within TAP test sequences for fully automated wafer and chip scale test solution for Integrated Photonics.
Keysight Test Automation on PathWave (TAP) is a modern Microsoft .NET-based application that can be used stand-alone or in combination with higher level test executive software environments. Instrument plugins provide test steps that can be added to work-flow sequences without needing to use instrument level programming commands. The N7700210C Wafer Prober plugin further simplifies automation by handling the interface to the Formfactor semi-automated probe station hardware and Formfactor Velox and Silicon Photonics Tools software. Test steps realize wafer chuck movement and probe positioning and alignment tasks within a test plan and can be combined with instrument test execution steps. Easy configuration of wafer prober settings for positioning, and for RF and optical probes are included in the test steps.

Keysight’s wafer prober sample test plan with prober steps

List of device elements and example of element optical IO port characteristics
Learn more about PathWave Test Automation and Integrated Photonics Test
Demodulate a wide range of signals with modulations from BPSK to 4096 QAM plus presets for many cellular, wireless networking, and digital video standards.
Demodulate a wide range of signals with modulations from BPSK to 4096 QAM plus presets for many cellular, wireless networking, and digital video standards.
89601AYAC
Demodulate a wide range of signals with modulations from BPSK to 4096 QAM plus presets for many cellular, wireless networking, and digital video standards.
Enables polarization-dependent swept-wavelength multichannel measurements with the PAS LS engine and PAS IL/PDL engine, as well as measurements without varying polarization with the PAS LS engine and PAS FSIL engine.
Enables polarization-dependent swept-wavelength multichannel measurements with the PAS LS engine and PAS IL/PDL engine, as well as measurements without varying polarization with the PAS LS engine and PAS FSIL engine.
N7700100C
Enables polarization-dependent swept-wavelength multichannel measurements with the PAS LS engine and PAS IL/PDL engine, as well as measurements without varying polarization with the PAS LS engine and PAS FSIL engine.
Enables fast swept-wavelength multichannel measurements with the PAS LS engine and PAS FSIL engine.
Enables fast swept-wavelength multichannel measurements with the PAS LS engine and PAS FSIL engine.
N7700102C
Enables fast swept-wavelength multichannel measurements with the PAS LS engine and PAS FSIL engine.
Enables swept-wavelength measurement of differential group delay (DGD) and polarization mode dispersion (PMD), as well as IL (also for TE/TM polarization) and PDL with the N7788C and the PAS LS engine.
Enables swept-wavelength measurement of differential group delay (DGD) and polarization mode dispersion (PMD), as well as IL (also for TE/TM polarization) and PDL with the N7788C and the PAS LS engine.
N7700103C
Enables swept-wavelength measurement of differential group delay (DGD) and polarization mode dispersion (PMD), as well as IL (also for TE/TM polarization) and PDL with the N7788C and the PAS LS engine.
The S97010B time domain analysis capability allows you to measure the time domain response of a device. The analyzer can transform frequency domain data to the time domain or time domain data to the frequency domain.
The S97010B time domain analysis capability allows you to measure the time domain response of a device. The analyzer can transform frequency domain data to the time domain or time domain data to the frequency domain.
S97010B
The S97010B time domain analysis capability allows you to measure the time domain response of a device. The analyzer can transform frequency domain data to the time domain or time domain data to the frequency domain.
The time domain capability allows you to measure the time domain response of a device. The analyzer can transform frequency domain data to the time domain or time domain data to the frequency domain.
The transform used by the analyzer resembles time domain reflectometry (TDR) measurements. TDR measurements, however, are made by launching an impulse or step into the test device and observing the response in time with a receiver similar to an oscilloscope. In contrast, the analyzer makes swept frequency response measurements, and mathematically transforms the data into a time domain reflectometer-like display.
The S97010B software is compatible with the Keysight Streamline Series Vector Network Analyzers.
Learn more about Keysight Network Analyzer Software
Keysight 89601200C provides advanced vector signal analysis with hardware connectivity or recording with no limits on the center frequency and IF/BBIQ bandwidth, up to 64 measurement channels and 512 parallel VSA instances
Keysight 89601200C provides advanced vector signal analysis with hardware connectivity or recording with no limits on the center frequency and IF/BBIQ bandwidth, up to 64 measurement channels and 512 parallel VSA instances
89601200C
Keysight 89601200C provides advanced vector signal analysis with hardware connectivity or recording with no limits on the center frequency and IF/BBIQ bandwidth, up to 64 measurement channels and 512 parallel VSA instances
Offers fully automated stress eye calibration and receiver testing for 800G and 1.6T modules with 100G and 200G / λ optical interfaces.
Offers fully automated stress eye calibration and receiver testing for 800G and 1.6T modules with 100G and 200G / λ optical interfaces.
N4917DJCA
Offers fully automated stress eye calibration and receiver testing for 800G and 1.6T modules with 100G and 200G / λ optical interfaces.
The Keysight N4917DJCA solution consists of the software application, an M8050A 120 Gbaud high-performance bit error ratio tester, an interference source, an optical reference transmitter, an optical sampling oscilloscope, a tunable laser source, and an optical attenuator. Automated calibration ensures a high level of accuracy and repeatability and speeds up calibration and test time significantly compared to manual operation.
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Functionalities