Medalist i1000D In-Circuit Test System Family

Medalist i1000D In-Circuit Test System Family

U9401B/U9405A/U9403A

Keysight Medalist i1000D In-Circuit Tester (ICT) Family

U9401B – Medalist Standard i1000D

U9405A – Medalist SFP i1000D (In-Line/Off Line type)

U9403A – Medalist i1000D Mini-ICT

Introduction

Keysight Medalist i1000D redefines digital test to provide electronics manufacturers with user-friendly and affordable testing for digital devices. The Medalist i1000D is now even better. Improving from its previous state of an analog-only ICT, the new digital release of the system now features per pin programmable digital cards with a whole new set of intuitive software graphical user interfaces (GUIs) that makes programming and development effortless. With its new digital capabilities, the Medalist i1000D performs digital PCF/ VCL library-based testing, boundary scan, and I2C/ SPI serial programming at a low-cost by using a simple long-wired test fixture. This presents an excellent opportunity for better test coverage without any increase in cost. The digital subsystem of the i1000D harnesses the simplicity and power from the industry-leading Medalist i3070 ICT, to bring you the power to adjust test speeds, drive, and receive voltages with just a few clicks of the mouse.

Ease of Use

Retaining the simple and intuitive features of the previous U9401/2A model, the new Medalist i1000D software adds to its arsenal new features that make development and debugging of digital tests easy. Following the development model of a typical manufacturing defects analyzer, you can now get a fixture and program up and running in just a few days. When the digital test is required, merely assign the test libraries and power supplies using the new developer GUI and let the i1000D software do the rest; Figure 1. Simplified GUIs allow the user to quickly make changes to individual tests while debugging, with a comprehensive set of menus and buttons, complete with auto debug features. This allows inexperienced users to utilize the system quickly. With the Medalist i1000D, unpowered passive analog components can debug with the click of a button, so even someone with limited ICT experience can perform a complete analog test debug in a matter of hours. Auto debug fine tunes tests, so boards pass reliably in production. Statistical measures (CPK: Process Capability Index) are employed to determine the stability of the test. This automatic feature reduces the normal debug process to just a few hours.

System Highlights

Digital test is known as complex, and difficult to debug. With the i1000D, testing is straightforward. The digital debug GUI leverages the control and flexibility of the legendary i3070 PushButton debug GUI, to allow engineers and technicians to have full control of the digital test parameters and test source codes, yet making it easy to understand. You can achieve this by transforming lines of the complicated digital test source codes into simple, easy to understand graphical waveforms. Engineers and technicians performing debug do not see the massive lines of codes; screen capture as in Figure 2.