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DS1121A Bidirectional Fault Injection Probe
Add EM pulses to your fault injection testing setup
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Induce electromagnetic pulses to perform localized faults on modern chips.
Highlights
The Keysight DS1121A bidirectional fault injection probe induces high power, electromagnetic (EM) pulses on a user-defined chip location. The fast and predictable pulse meets the demands of international testing laboratories and manufacturers.
Testers can control the set of probes, XY table, and camera with Keysight’s EM fault injection software, which also allows automation of testing scenarios and easy reporting for further analysis and refinements. Use the bidirectional fault injection probe in stand-alone or custom environments—or integrate with your own hardware and software.
With increasingly challenging chip packages and sophisticated light-sensitive sensors to prevent optical laser faults, this new testing vector for fault injection scenarios bypasses traditional measures and takes the next step in high-end security tests.
The Keysight bidirectional fault injection probe offers the following features:
- Does not require chip de-packaging
- Light sensor meshes do not detect EM glitches
- Flips value of logic cells on target device
- Offers lower chance of permanent chip damage compared to laser glitching
- Enables adjustable high power pulses and includes different coils to generate different EM fields over a chip
- Allows configuration of fast and short pulses with software
- Provides fast and predictable response to trigger
- Fits Keysight precision XYZ stage and multimode fault injection laser for automated scanning
- Includes standard EM-FI transient coils and one crescent probe ferrite
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