How to Automate Silicon Photonics Wafer-Level Power Sweeps

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Power Sweeps for Silicon Photonics Wafers

Wafer‑level testing of silicon photonic devices requires precise control and verification of optical power delivered to each test site. Devices such as photodetectors, modulators, and passive waveguides exhibit strong sensitivity to input power, wavelength, and polarization, while grating coupler efficiency, fiber alignment, and process variation introduce significant site‑to‑site variability across a wafer.

To accurately extract parameters such as insertion loss, responsivity, saturation behavior, and sensitivity thresholds, engineers must control wavelength, align optical polarization to the waveguide mode, and verify the actual optical power delivered to the device under test. Automated optical power sweep workflows enable consistent, repeatable measurements across thousands of die in wafer probe station environments.

Silicon Photonics Wafer-Level Optical Power Sweep Solution

Accurate wafer‑level optical power sweeps require coordinated control of wavelength, polarization, and optical power at the device under test. Keysight’s wafer‑level optical power sweep solution combines a tunable laser source with polarization control and calibrated optical power measurement to deliver repeatable, traceable optical input conditions across wafer‑scale test environments. The tunable laser provides wavelength‑accurate optical signals for device characterization across operating bands. Polarization control aligns the optical field to the photonic device’s supported mode, ensuring consistent coupling and reducing measurement uncertainty. An optical power meter verifies the delivered power at the probe interface, enabling precise, repeatable optical power sweeps independent of coupling or alignment variation.

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How to Automate Wafer‑Level Optical Power Sweeps for Silicon Photonics block diagram

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