Sample Program: High Speed fT vs. Ic Characterization of Bipolar Transistors Using an E5270A and an ENA

This sample program for high speed fT vs. Ic characterization is developed with HP BASIC or HT BASIC environments. After downloading this sample program "FT-IC.BAS":

1. Load the FT-IC.BAS program by using the GET command in the HP/HT BASIC.
2. Modify necessary parts such as the GPIB address of the ENA.
3. Execute the program by selecting the RUN softkey.

Then the measurement results are saved into the "FT-IC.CSV" file. You can make any data processing with your spreadsheet application such as Microsoft Excel®.

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