IC-CAP Key Features

Integrated Circuit Characterization and Analysis Program (IC-CAP) is the industry standard software for DC and RF semiconductor device characterization and modeling. IC-CAP extracts accurate compact models for use in high speed/digital, analog and power RF applications. IC-CAP offers device engineers and designers a state of-the-art modeling tool that fills numerous modeling needs, including automated instrument control, data acquisition, parameter extraction, graphical analysis, simulation, optimization, and statistical analysis.

All of these capabilities are combined in a flexible, automated and intuitive software environment for efficient and accurate extraction of active, passive and user-defined devices and circuits. Today’s most advanced semiconductor foundries and Integrated Device Manufacturers (IDMs) rely on IC-CAP for modeling silicon CMOS, Bipolar, compound gallium arsenide (GaAs), gallium nitride (GaN), and many other device technologies.

For more information about IC-CAP, download the IC-CAP Technical Overview.

Key Features

• Open software architecture enables you to achieve maximum accuracy by integrating your own modeling expertise and methodologies, and provides ultimate flexibility to create and automate measurement, extraction and verification procedures.
• Turnkey extraction solutions for industry standard CMOS models, such as BSIM3/BSIM4, PSP, HiSIM, and HiSIM_HV minimize the learning curve and maximize model accuracy.
• Unique nonlinear high-frequency modeling with Keysight HBTs, Root models, high frequency BJT, MESFET, PHEMT, and state-of-theart VerilogA models.
• Direct links to most commercial simulators (e.g., ADS, HSPICE, Spectre, and ELDO) ensure consistency between extracted models and the simulators used by circuit designers.
• The most advanced and complete on-wafer automated measurement and characterization environment with IC-CAP Wafer Professional.
• Powerful data handling capabilities.

Return to IC-CAP Device Modeling Software.