Model your devices across their linear and non-linear regions with pulsed measurements

With a pulsed IV and S-parameters measurement system from Maury and Keysight you can characterize and model your devices across their entire linear and nonlinear operating range providing a better understanding of your device technology and more accurate simulations for your product development.

  • Pulsed measurement of IV characteristics and S-parameters
  • Pulsed measurements can eliminate heating and trapping effects
  • Allows active device modeling under quasi-isothermal conditions
  • Model your devices across their linear and non-linear operating regions
  • Uses Keysight PNA-X for pulsed measurement of S-parameters
  • Pulsed measurements provide more accurate simulation of your active devices
  • Request more information and Keysight’s partner, Maury Microwave, will contact you to discuss your requirements in more detail.