New and updated features in IC-CAP 2014.04
- DynaFET model generation software for GaN HEMTs
- BSIM-CMG model generation software for 3D FinFETs
- BSIM6 model generation software for bulk MOSFETs
- Python/PEL Programming Editor
- New Instrument Driver for Keysight N6705B
Introducing IC-CAP 2014.04
Addressing the semiconductor industry’s latest technology needs, IC-CAP 2014.04 introduces three new model generation software products, DynaFET for GaN HEMTs, BSIM-CMG for 3D FinFETs, and BSIM6 for bulk MOSFETs. Other model generation packages have also been updated to newer model versions (BSIM4 v4.8, HiSIM2 v2.7.0/v2.6.1, HiSIM_HV v2.1.0/1.2.4/1.2.3, and PSP v103.2.0/103.1.2). The new release provides considerable speedup in simulations using HSpice, Spectre, and Eldo. Power users of IC-CAP who routinely develop Python/PEL code in IC-CAP will find it much more convenient and productive to program in the programming editor that provides such highly desirable features as auto-completion and color coding. A number of enhancements in IC-CAP WaferPro make it easier than ever to create, manage, monitor, and debug test plans. IC-CAP 2014.04 has added full support for the N6705B DC Power Analyzer.
DynaFET Model Generation Package
This model generation package is an integral part of Keysight DynaFET GaN HEMT characterization, modeling, and simulation technology. It allows for accurate fitting in a single model to DC, linear, and large-signal measurement, and makes it possible to use the same model for design of different applications under various bias conditions. For circuit simulations, the DynaFET model is supported in Advanced Design System (ADS) 2014.01 for time-domain (i.e. transient) as well as frequency-domain analysis. For more information, refer to the W8534EP IC-CAP DynaFET Model Generation software.
BSIM-CMG Model Generation Package
This model generation package provides a complete, turn-key model extraction solution for BSIM-CMG which is the semiconductor industry’s standard SPICE model for common multi-gate MOSFETs, such as 3D FinFETs. It has been developed based on a physical, global model extraction strategy. The model extraction flow is fully customizable so that user-specific model extraction strategies, such as de-embedding methodologies, extraction steps and sequence, etc. can be easily incorporated. For more information, refer to the W8616 BSIM-CMG Model Generation software.
BSIM6 Model Generation Package
This model generation package provides a complete, turn-key model extraction solution for BSIM6, semiconductor industry’s newest standard model for bulk MOSFETs. It has been developed based on a physical, global model extraction strategy. The model extraction flow is fully customizable so that user-specific model extraction strategies, such as de-embedding methodologies, extraction steps and sequence, etc. can be easily incorporated. For more information, refer to the W8615 BSIM6 Model Generation software.
Enhanced Wafer Professional (WaferPro)
IC-CAP WaferPro add-on software now has a built-in simulation capability. The user can run a test plan in the simulation mode for debugging or sanity-check in IC-CAP WaferPro without requiring a license for the IC-CAP simulation and analysis software. Other enhancements in IC-CAP WaferPro allow the user to create test plans in a single window for maximum efficiency, to easily access test plan details at any hierarchical level, to monitor real-time the progress and queued tasks of a test plan in execution, and to perform debugging measurement on any step(s) and devices in a test plan without extra setup effort at all!
Windows XP Discontinuance
As previously announced, Windows XP support has been discontinued in IC-CAP 2014.04.
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