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사이트 기능 및 성능 향상을 위해 브라우저 쿠키를 활성화하십시오.
관련 가격, 특별 행사, 이벤트 및 연락처 정보를 보시려면 국가를 선택하여 주십시오.
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High-Volume PIC Test
New polarization alignment and stabilized polarization sweeps are especially valuable for on-wafer and PIC testing, including probe alignment. Learn about Keysight’s turnkey solution for polarization optimization based on the Mueller Matrix technique to greatly reduce measurement and start-up times. We will demonstrate how to make insertion loss (IL), polarization-dependent loss (PDL), transverse electric(TE)/transverse magnetic (TM), and responsivity measurements in a single sweep without polarization alignment.
- Fast single-sweep PDL
- TE/TM and pol-alignment
- Scalable: λ-bands, ports