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High-Volume PIC Test

New polarization alignment and stabilized polarization sweeps are especially valuable for on-wafer and PIC testing, including probe alignment. Learn about Keysight’s turnkey solution for polarization optimization based on the Mueller Matrix technique to greatly reduce measurement and start-up times. We will demonstrate how to make insertion loss (IL), polarization-dependent loss (PDL), transverse electric(TE)/transverse magnetic (TM), and responsivity measurements in a single sweep without polarization alignment.

Solution Capabilities:

  • Fast single-sweep PDL
  • TE/TM and pol-alignment
  • Scalable: λ-bands, ports

Application Note

Wafer and Chip-Level Optical Test

Technical Overview

Photonic Application Suite

Data Sheets

N7744C and N7745C Optical Multiport Power Meters

N777xC Family of Tunable Laser Sources

N7781C Polarization Analyzer

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