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Integrated RF Test Solution
PXI-based, high performance ATE for component, SOC and SIP test
Combining Marvin Test Solutions’ TS-960e PXI platform with Keysight Technologies’ RF instrumentation, customers can address a wide range of RF and mixed-signal devices for both wafer and packaged test.
- 21 slot, manipulator-ready, high power PXIe platform with integrated receiver
- Supports a wide range of RF test applications, 9 KHz to 50 GHz; for wafer and packaged test
- RF instrumentation options include Keysight’s vector signal generators, vector signal analyzers, and vector network analyzers
- Advanced digital subsystem, with PMU, and timing per pin with sub-nsec edge placement
- Support for baseband test applications using MTS and Keysight PXI/PXIe switching and instrumentation
- Full featured, open architecture software tools support device characterization and production test