Per saperne di più
keysight:models/uu/uu102lab,segmentation:campaign/Education,segmentation:funnel/tofu,keysight:dtx/solutions/facets/development-area/power,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/design-and-test-product/power-supply,keysight:dtx/solutions/facets/industry/semiconductor,segmentation:product-category/IC_Semi_Mfg,segmentation:business-unit/CSG,segmentation:product-category/IC_Semi_Mfg/Semiconductor_Test,keysight:product-lines/1hkeysight:models/uu/uu102lab,segmentation:campaign/Education,segmentation:funnel/tofu,keysight:dtx/solutions/facets/development-area/power,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/design-and-test-product/power-supply,keysight:dtx/solutions/facets/industry/semiconductor,segmentation:product-category/IC_Semi_Mfg,segmentation:business-unit/CSG,segmentation:product-category/IC_Semi_Mfg/Semiconductor_Test,keysight:product-lines/1hkeysight:models/uu/uu102lab,segmentation:campaign/Education,segmentation:funnel/tofu,keysight:dtx/solutions/facets/development-area/power,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/design-and-test-product/power-supply,keysight:dtx/solutions/facets/industry/semiconductor,segmentation:product-category/IC_Semi_Mfg,segmentation:business-unit/CSG,segmentation:product-category/IC_Semi_Mfg/Semiconductor_Test,keysight:product-lines/1hkeysight:models/uu/uu102lab,segmentation:campaign/Education,segmentation:funnel/tofu,keysight:dtx/solutions/facets/development-area/power,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/design-and-test-product/power-supply,keysight:dtx/solutions/facets/industry/semiconductor,segmentation:product-category/IC_Semi_Mfg,segmentation:business-unit/CSG,segmentation:product-category/IC_Semi_Mfg/Semiconductor_Test,keysight:product-lines/1hkeysight:models/uu/uu102lab,segmentation:campaign/Education,segmentation:funnel/tofu,keysight:dtx/solutions/facets/development-area/power,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/design-and-test-product/power-supply,keysight:dtx/solutions/facets/industry/semiconductor,segmentation:product-category/IC_Semi_Mfg,segmentation:business-unit/CSG,segmentation:product-category/IC_Semi_Mfg/Semiconductor_Test,keysight:product-lines/1hkeysight:models/uu/uu102lab,segmentation:campaign/Education,segmentation:funnel/tofu,keysight:dtx/solutions/facets/development-area/power,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/design-and-test-product/power-supply,keysight:dtx/solutions/facets/industry/semiconductor,segmentation:product-category/IC_Semi_Mfg,segmentation:business-unit/CSG,segmentation:product-category/IC_Semi_Mfg/Semiconductor_Test,keysight:product-lines/1hkeysight:models/uu/uu102lab,segmentation:campaign/Education,segmentation:funnel/tofu,keysight:dtx/solutions/facets/development-area/power,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/design-and-test-product/power-supply,keysight:dtx/solutions/facets/industry/semiconductor,segmentation:product-category/IC_Semi_Mfg,segmentation:business-unit/CSG,segmentation:product-category/IC_Semi_Mfg/Semiconductor_Test,keysight:product-lines/1hkeysight:models/uu/uu102lab,segmentation:campaign/Education,segmentation:funnel/tofu,keysight:dtx/solutions/facets/development-area/power,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/design-and-test-product/power-supply,keysight:dtx/solutions/facets/industry/semiconductor,segmentation:product-category/IC_Semi_Mfg,segmentation:business-unit/CSG,segmentation:product-category/IC_Semi_Mfg/Semiconductor_Test,keysight:product-lines/1hkeysight:models/uu/uu102lab,segmentation:campaign/Education,segmentation:funnel/tofu,keysight:dtx/solutions/facets/development-area/power,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/design-and-test-product/power-supply,keysight:dtx/solutions/facets/industry/semiconductor,segmentation:product-category/IC_Semi_Mfg,segmentation:business-unit/CSG,segmentation:product-category/IC_Semi_Mfg/Semiconductor_Test,keysight:product-lines/1hkeysight:models/uu/uu102lab,segmentation:campaign/Education,segmentation:funnel/tofu,keysight:dtx/solutions/facets/development-area/power,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/design-and-test-product/power-supply,keysight:dtx/solutions/facets/industry/semiconductor,segmentation:product-category/IC_Semi_Mfg,segmentation:business-unit/CSG,segmentation:product-category/IC_Semi_Mfg/Semiconductor_Test,keysight:product-lines/1hkeysight:models/uu/uu102lab,segmentation:campaign/Education,segmentation:funnel/tofu,keysight:dtx/solutions/facets/development-area/power,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/design-and-test-product/power-supply,keysight:dtx/solutions/facets/industry/semiconductor,segmentation:product-category/IC_Semi_Mfg,segmentation:business-unit/CSG,segmentation:product-category/IC_Semi_Mfg/Semiconductor_Test,keysight:product-lines/1h
Come eseguire misurazioni parametriche su wafer
Scoprite come questa soluzione per laboratori didattici nel settore dei semiconduttori sia incentrata sui test parametrici e sulle misurazioni su wafer. Offre alle università un ambiente didattico completo e in linea con le esigenze del settore, che permette agli studenti di familiarizzarsi con le pratiche di misurazione dei semiconduttori utilizzate nel mondo reale.
Per saperne di più