En savoir plus
segmentation:campaign/IC_Semi_Mfg,segmentation:product-category/IC_Semi_Mfg,segmentation:product-category/IC_Semi_Mfg/Semiconductor_Test,segmentation:business-unit/EISG,keysight:dtx/solutions/facets/design-and-test-product/photonic-and-optical-test,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductor,segmentation:funnel/bofu,keysight:product-lines/1h,keysight:models/b2/b2901clsegmentation:campaign/IC_Semi_Mfg,segmentation:product-category/IC_Semi_Mfg,segmentation:product-category/IC_Semi_Mfg/Semiconductor_Test,segmentation:business-unit/EISG,keysight:dtx/solutions/facets/design-and-test-product/photonic-and-optical-test,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductor,segmentation:funnel/bofu,keysight:product-lines/1h,keysight:models/b2/b2901clsegmentation:campaign/IC_Semi_Mfg,segmentation:product-category/IC_Semi_Mfg,segmentation:product-category/IC_Semi_Mfg/Semiconductor_Test,segmentation:business-unit/EISG,keysight:dtx/solutions/facets/design-and-test-product/photonic-and-optical-test,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductor,segmentation:funnel/bofu,keysight:product-lines/1h,keysight:models/b2/b2901clsegmentation:campaign/IC_Semi_Mfg,segmentation:product-category/IC_Semi_Mfg,segmentation:product-category/IC_Semi_Mfg/Semiconductor_Test,segmentation:business-unit/EISG,keysight:dtx/solutions/facets/design-and-test-product/photonic-and-optical-test,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductor,segmentation:funnel/bofu,keysight:product-lines/1h,keysight:models/b2/b2901clsegmentation:campaign/IC_Semi_Mfg,segmentation:product-category/IC_Semi_Mfg,segmentation:product-category/IC_Semi_Mfg/Semiconductor_Test,segmentation:business-unit/EISG,keysight:dtx/solutions/facets/design-and-test-product/photonic-and-optical-test,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductor,segmentation:funnel/bofu,keysight:product-lines/1h,keysight:models/b2/b2901clsegmentation:campaign/IC_Semi_Mfg,segmentation:product-category/IC_Semi_Mfg,segmentation:product-category/IC_Semi_Mfg/Semiconductor_Test,segmentation:business-unit/EISG,keysight:dtx/solutions/facets/design-and-test-product/photonic-and-optical-test,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductor,segmentation:funnel/bofu,keysight:product-lines/1h,keysight:models/b2/b2901clsegmentation:campaign/IC_Semi_Mfg,segmentation:product-category/IC_Semi_Mfg,segmentation:product-category/IC_Semi_Mfg/Semiconductor_Test,segmentation:business-unit/EISG,keysight:dtx/solutions/facets/design-and-test-product/photonic-and-optical-test,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductor,segmentation:funnel/bofu,keysight:product-lines/1h,keysight:models/b2/b2901clsegmentation:campaign/IC_Semi_Mfg,segmentation:product-category/IC_Semi_Mfg,segmentation:product-category/IC_Semi_Mfg/Semiconductor_Test,segmentation:business-unit/EISG,keysight:dtx/solutions/facets/design-and-test-product/photonic-and-optical-test,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductor,segmentation:funnel/bofu,keysight:product-lines/1h,keysight:models/b2/b2901clsegmentation:campaign/IC_Semi_Mfg,segmentation:product-category/IC_Semi_Mfg,segmentation:product-category/IC_Semi_Mfg/Semiconductor_Test,segmentation:business-unit/EISG,keysight:dtx/solutions/facets/design-and-test-product/photonic-and-optical-test,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductor,segmentation:funnel/bofu,keysight:product-lines/1h,keysight:models/b2/b2901clsegmentation:campaign/IC_Semi_Mfg,segmentation:product-category/IC_Semi_Mfg,segmentation:product-category/IC_Semi_Mfg/Semiconductor_Test,segmentation:business-unit/EISG,keysight:dtx/solutions/facets/design-and-test-product/photonic-and-optical-test,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductor,segmentation:funnel/bofu,keysight:product-lines/1h,keysight:models/b2/b2901clsegmentation:campaign/IC_Semi_Mfg,segmentation:product-category/IC_Semi_Mfg,segmentation:product-category/IC_Semi_Mfg/Semiconductor_Test,segmentation:business-unit/EISG,keysight:dtx/solutions/facets/design-and-test-product/photonic-and-optical-test,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductor,segmentation:funnel/bofu,keysight:product-lines/1h,keysight:models/b2/b2901cl
Comment réaliser un test fonctionnel d'un circuit intégré photonique
Découvrez comment réaliser des tests fonctionnels sur des circuits intégrés photoniques à l'aide de mesures de balayage de longueur d'onde, de polarisation, de puissance optique et de SMU.
En savoir plus