Reduce Prototype Testing Cost with the Medalist i1000D

This paper discusses the requirements for a test strategy at the prototype production stage, and how to reduce prototype testing costs with the Medalist i1000D.

High-Power Test Applications for Green Energy Technology

What is a regenerative power supply? How can you reduce energy consumption? Why does it matter in the operation of a power supply? Get the answer to your questions!

Pick the Right Source: Reliable Network Analyzers Starts with a Clean Signal

This paper covers the upgraded DDS source and how it outclasses the previous PLL source in the PNA and PNA-X network analyzers.

How to Find Harmonics in an AC Signal

Learn what harmonics are and see how harmonic ratio functions in the U1240 Series Handheld DMM helps to quickly verify the presence of harmonics in AC signals.

Solutions for Active Device Test : Using Modern VNAs to Automate Traditional Multi-instrument RF Test Systems

This app note, Using Modern VNAs to Automate Traditional Multi-instrument RF Test Systems, shows how test system designers can design simpler test systems with the lowest overall cost of ownership.

The Wi-Fi 6E Challenge in Regulatory Test

This application note explains the evolution of Wireless Standard Wi-Fi 6E in Regulatory test.

SATA II Drive and Cable SI Testing Using the 86100C DCA-J

Get an overview of SATA, how to set up an SATA cable using 86100 DCA-J to determine whether the cables meet the SATA standard.

How Auto-Parallel Capability Extends the Range of Bench Power Supply

Learn how to enable auto-parallel power supplies in 2 easy steps using the auto-parallel mode of the E36300 to provide a higher output current power supply.

Efficient Structure Creation and Data Processing for Photonic Device Simulation

As photonic devices become increasingly sophisticated, creating and managing complex structures manually can quickly become a bottleneck. From CMOS image sensors and grating couplers to metalenses containing tens of thousands of nano-scale elements, traditional CAD-based workflows often require significant time and effort.This article explores how the RSoft Python API streamlines photonic design by automating structure creation, simulation execution, and data processing. Learn how users can generate complex geometries from equations or external datasets, launch FDTD and RCWA simulations directly from Python, and build customized workflows for advanced analysis and optimization.Discover practical examples featuring CIS, metalens, and grating coupler designs, and see how automation can dramatically reduce development time while improving scalability, flexibility, and productivity in photonic device modeling.

Integrating Supplementary Electronic Tests

This application note is designed for electronics manufacturing professionals seeking to optimize their PCB testing processes. It provides detailed insights into integrating supplementary electronic tests, such as ISP, into the Keysight i3070 Series 7i ICT system. The document highlights the benefits, challenges, and step-by-step guidance for implementing these tests, making it an essential resource for improving test efficiency and product reliability.

Better Limits Setting with PAT Limit Recommendation

Part Average Testing (PAT) is a method that uses robust statistics to detect outliers, which is widely used in the automotive industry. PathWave Manufacturing Analytics (PMA) uses PAT to detect PAT anomalies and PAT Limit recommendations. This article will go over the PAT recommendations module in more detail.

New i3070 Series 6 is 1.5x Faster than the Series 5

This application note summarizes some of the results of Vectorless Test Enhanced Probe (VTEP) early tests conducted at customer sites.

Addressing Key Challenges in Automotive PCBA Testing

This application note explores the testing challenges of modern automotive PCBAs, including high-density designs, low-current measurements, and high pin counts. It introduces the Keysight i3070 Series 7i ICT system as a robust solution to optimize testing processes, streamline workflows, and improve test coverage for automotive electronics manufacturers.

Waveform Sequencing with PathWave BenchVue Waveform Builder Pro

The application note covers how to implement waveform sequencing using 33503A PathWave BenchVue Waveform Builder Pro, supported by Keysight 33500B and 33600A Series Trueform waveform generators.

Real-Time Manufacturing Oversight with PMA TV Mode

This application note delves into the TV Mode feature of PathWave Manufacturing Analytics (PMA), showcasing how it enables real-time monitoring of production lines using andon light indicators. Learn how TV Mode provides customizable, high-level insights to detect issues promptly and maintain efficient operations.

Barcode Scanning Implementation

See how you can set up a barcode scanner on the i7090 Massively Parallel In-Circuit Test System without needing an operator to manually scan the barcode on PCBs.

Integrating LED Analyzer with Keysight's In-Circuit Tester

This application note explores how to seamlessly integrate the FEASA F LED Analyzer with Keysight's i3070 Series 7i In-Circuit Test System to streamline LED testing processes.

Bypass Link Conveyor Built-in i7090 and i3070 In-Circuit Inline Tester

The built-in bypass link conveyor in In-Circuit tester saves you the floor space and easy to setup at the manufacturing floor.

ITU Radio Regulations and Keysight’s Measurement Approach

Explore commonly referenced ITU-R Recommendations for making radio monitoring measurements including background and guidance on spectrum monitoring techniques and the Keysight solutions that address the measurement requirements.

Automated Testing in Retail Banking with Keysight Eggplant Test

Keysight Eggplant Test (hereafter called “Eggplant”) can be used in many different industries, including retail banking. In this sector, Eggplant proves useful for automating a variety of test cases. This application note illustrates how to use Eggplant for testing a simulated automated teller machine (ATM).