Decoding NFC-F Based on Manchester-encoded ASK Modulation

Step-by-step instructions on how to setup oscilloscopes to decode and trigger on NFC-F poller and listener communication for Manchester encoded ASK modulation.

Optimizing Thermocouple Measurements in a Noisy Environment

There are many sources of noise that can affect thermocouple measurements. This paper covers ground loops, electromagnetic fields and rotating equipment.

Functional Assisted GPS Receiver Testing

Learn to perform assisted GPS receiver testing using the 8960 Wireless Communication Test Set with a Vector Signal Generator and GPS Personality in cellular devices.

How to Convert from a Sorensen DLM to an N5700

Read an overview of similarities and differences between Keysight N5700 and Sorensen DLM to help current Sorensen DLM owners to convert to N5700A Series.

Addressing DC Power Test Challenges for Base Station Subassemblies

How to address DC power test challenges during development and production test of base station subassemblies using DC power analyzers and modular power system.

Why Migrate from the 4155C and 4156C to the B1500A?

This application note shows you the advantages of migrating from 4155C/56C to B1500A.

TS-8989 System Integration Guide

Read how to integrate the TS-8989 in a typical rack, learn key considerations when determining rack type, power distribution, mass interconnect and cabling.

Correlating Microwave Measurements between Benchtop and Handheld Analyzers

Learn about Keysight’s new handheld analyzers and microwave measurement comparisons between FieldFox handheld analyzers and several benchtop instruments.

Characterization of LTE Devices Made Simple

See how easy it is to characterize LTE devices using MXA signal analyzers with a touchscreen UI that includes drop down menus to speed up LTE design testing.

Conducting Site Surveys Using Handheld Spectrum Analyzers

Learn how conducting site surveys is made easy by using the N934xC handheld spectrum analyzer with site survey tools like signal strength mapping and new GPS capability.

LTE-Advanced Manufacturing Test

This application note gives insight into how to better understand the requirements for LTE-Advanced Carrier Aggregation manufacturing test.

Using BenchVue Software’s Test Flow Application to Characterize Transistors

Learn how to make a simple transistor curve tracer using Keysight’s BenchVue Test Flow app previously unavailable in common curve tracer hardware.

Fast Sweep Polarization Dependent Loss (PDL) Measurements

This application note describes an approach to significantly reduce the measurement time associated with polarization dependent loss (PDL) measurements.

Using the Graphical Pin Locator on Medalist ICT Systems

The graphical locator tool on the Keysight Medalist In-Circuit Test (ICT) System is an improvement over the old “Find Pins” tool. Give it a try!

Solutions for 802.11p Wireless Access in Vehicular Environments Measurements

This application note looks in detail at the 802.11p standard and at how 802.11p devices can be designed, tested and analyzed. Learn more.

FPGA Circuit Design: Overcoming Power-Related Challenges

Learn to overcome power-related challenges with FPGA circuit design and reasons why the N6705A DC power analyzer meets all FPGA circuit power testing needs.

Displaying Menus in Two Languages on Medalist i3070 GUI

Keysight’s Medalist i3070 menu-based GUI allows users to point and click on commands in a menu to control the ICT system and concurrently display 2 languages.

TDK Corp. Power Circuit Simulation Leads to Improvement

See how TDK Corporation realized significant improvement in analysis accuracy in power circuit simulation using circuit simulators from Keysight.

Connected Car: Managing Wireless System Complexities

This paper presents how the automotive industry can easily adopt test methodologies used in managing wireless system complexities in the connected car

Enhancing EMC Testing with Digital IF

Discover the differences between analog and digital IF architecture and explain how digital IF enhances both pre-compliance and compliance test processes.