How to De-Embed High-Speed Test Fixtures

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Modular Sampling Oscilloscope
+ Modular Sampling Oscilloscope
Modular Sampling Oscilloscope
+ Modular Sampling Oscilloscope

Remove Fixture Effects from High-Speed Measurements

High-speed measurements often include the combined response of the device under test and the test fixtures, cables, or probes used to access it, making it difficult to isolate the true electrical behavior of the device. Engineers working with high-speed interconnects in 400G, 800G, and 1.6T systems must remove fixture-induced loss, reflections, and distortion to accurately evaluate device performance at the intended reference plane.

The de-embedding process requires characterizing the S-parameters of the fixture path with a TDR/TDT module of a sampling oscilloscope. The workflow applies mathematical correction techniques to remove the fixture contribution from the composite device-plus-fixture response and shift the reference plane to the device interface. This requires accurate fixture modeling, proper port definition, and validated de-embedding techniques.

Test Fixture De-embedding Solution

De-embedding high-speed test fixtures requires characterizing the fixture path and mathematically removing it from the measured response to recover the true device behavior at the intended reference plane. The Keysight test fixture de-embedding solution includes a modular sampling oscilloscope with a TDR/TDT module and signal integrity software that supports automatic fixture removal and S-parameter-based correction. The workflow enables engineers to apply fixture models, reassign ports, and shift the reference plane to the device interface so they can compare raw and corrected results and isolate device performance from fixture-induced effects.
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See the Block Diagram of Our Test Fixture De-Embedding Solution

Block Diagram of Our Test Fixture De-Embedding Solution

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