Go inside the development of the Pro XG7 Analog Signal Generator with the team behind its RF architecture. Hear the engineering decisions, explore the design challenges, and see measurements that connect source performance to device testing.
Get a closer look at how the team redesigned the RF architecture to integrate two complete signal generators into a compact 2U chassis. Explore side-by-side noise measurements against the previous generation, along with a demonstration of 20 ns leveled pulses.
India / Southeast Asia
1:30 PM SGT / 4:30 PM AET
Europe / Middle East
10:00 AM CET / 1:00 PM GST
Taiwan
1:30 PM CST
RF frequency coverage
9 kHz to 20 GHz
Low-noise RF stimulus
–135 dBc/Hz phase noise, typical
Calibrated output power
Up to +22 dBm
Dual-channel density
2 independent RF channels in 2U
Minimize phase noise, broadband noise, and spurs to distinguish device behavior clearly from source artifacts.
Preserve visibility for metrology-grade measurements with typical phase noise of –135 dBc/Hz at 10 GHz offset.
Drive demanding devices and lossy test paths with clean, calibrated output power up to +22 dBm in demanding tests.
Fit two independent RF channels into 2U, delivering 4× the channel density of an equivalent 8U two-instrument setup.
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