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A conventional test setup for measuring the current / voltage characteristics of a low-power integrated circuit (IC) requires a variety of basic instruments. The setup includes multiple power supplies to supply the required voltage to various test ports with different voltage requirements and digital multimeters (DMMs) for measuring voltage and current. Some test cases require pulse generators for simulating signals and digitizers for capturing signals in the time domain.
Use a source measure unit (SMU) as a power supply and an ammeter, voltmeter, and digitizer to perform multi-channel synchronous current / voltage (IV) measurements. Set instrument self-calibration and accurate measurement range before any sleep current measurements, especially for ICs with precision levels below milliamps (mA). For accurate dynamic measurements, the SMU’s sampling rate must be fast enough to capture signals during the transition from sleep to active state.
Additional resources for low-power IC characterization
LIV testing for VCSEL devices requires precise control of the injection current and light output power measurement to create the LIV curve. Learn how to perform narrow-pulsed LIV tests for your VCSEL devices under different operating conditions using a source / measure unit.
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Improving manufacturing operations requires understanding real-time insights about product quality, manufacturing processes, and equipment. Learn how to use information extracted from big data to improve manufacturing operations.
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Resistance measurements require eliminating error-inducing factors, such as residual test lead resistance, thermal electromotive force, and leakage currents in the measurement path. Learn how to address these measurement issues using a remote sense function (4-wire connection), offset compensation, and a guard function.
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