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W7801B PathWave WaferPro WGFMU Measurement
A flexible, open test executive platform to automate wafer-level low-frequency noise measurements of semiconductor devices and circuits with WGFMU
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Execute automated wafer-level low-frequency noise measurement with turnkey measurement drivers and measurement routines for WGFMU.
Highlights
The W7801B PathWave WaferPro WGFMU Measurement includes:
- Automated measurement without programing
- Auto prober control
- Wafer mapping
- Single data display for multi decade in frequency domain
- Upgradeable from your existing B1500A
The W7801B PathWave WaferPro Express WGFMU Measurement bundle efficiently performs at a low cost, an automated Random Telegraph Noise (RTN) measurement on the wafer using the B1500A Semiconductor Device Analyzer with the B1530A Waveform Generator/Fast Measurement Unit (WGFMU). It can improve the efficiency of RTN measurements and data analysis including wafer prober control.
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