Execute automated wafer-level low-frequency noise measurement with turnkey measurement drivers and measurement routines for WGFMU.


The W7801B PathWave WaferPro WGFMU Measurement includes:

  • Automated measurement without programing
  • Auto prober control
  • Wafer mapping
  • Single data display for multi decade in frequency domain
  • Upgradeable from your existing B1500A

The W7801B PathWave WaferPro Express WGFMU Measurement bundle efficiently performs at a low cost, an automated Random Telegraph Noise (RTN) measurement on the wafer using the B1500A Semiconductor Device Analyzer with the B1530A Waveform Generator/Fast Measurement Unit (WGFMU). It can improve the efficiency of RTN measurements and data analysis including wafer prober control.

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