The DS1120A Unidirectional Fault Injection Probe​ performs localized faults on modern chips using fast, predictable, and high-powered electromagnetic pulses.

Highlights

With increasingly challenging chip packages and sophisticated light-sensitive sensors employed to prevent optical laser faults, Keysight presents a new, powerful testing vector for fault injection (FI) scenarios on modern chips. The Unidirectional Fault Injection Probe induces fast, high-powered, electromagnetic pulses on a user-defined location of a chip. Unidirectional FI testing allows you to bypass traditional countermeasures and provides the next step in high-end security tests.

The DS1120A’s easy setup and testing process saves time, providing a fast and predictable pulse that meets international testing lab and manufacturer requirements. The set of probes, XY table, and camera offer a complete setup that testers can control and parameterize flexibly through the Inspector FI software. The software allows testing automation and easy reporting for further scenario analysis and refinements. The Unidirectional Fault Injection Probe can be used standalone or in custom environments as well as integrated with your own hardware and software. 

  • Does not require de-packaging the chip
  • Electromagnetic glitches not detected by light sensor meshes
  • Flips value of logic cells on target device
  • Lower chance of permanent chip damage compared to laser glitching
  • Adjustable, high-powered pulses
  • Different coils included to generate different electromagnetic fields over a chip
  • Fast and short pulses configurable from software
  • Fast and predictable response to trigger
  • Fits Precision XYZ Stage of High Precision Electromagnetic Probe for automated scanning

Mounts on Precision XYZ Stage of High Precision Electromagnetic Probe with:

  • 1 Crescent probe ferrite
  • High Precision Fault Injection Probe Tips​

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