Webinar
As RF measurements become more demanding, signal source performance can increasingly affect what engineers are able to characterize. Source-generated noise and spurs can obscure low-level device behavior, while test-path loss and multi-source measurements add complexity around signal level, rack space, cabling, and setup.
Join Keysight Product and R&D engineers for a 30-minute introduction to the new Pro XG7 analog signal generator. See the platform live, learn how its architecture addresses phase noise, broadband noise, spurious content, output power, and multi-channel test requirements, and understand how those design choices translate into real RF measurements.
RF engineers, system designers, and technical decision-makers working on high-performance RF measurements should attend. The session is especially relevant for teams managing source noise, lossy test paths, high-power stimulus, or multi-channel test setups in aerospace and defense, wireless, and advanced R&D environments.
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