How to Increase RF Density in Automated Testing

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Compact Multichannel RF Signal Generators
+ Compact Multichannel RF Signal Generators
Compact Multichannel RF Signal Generators
+ Compact Multichannel RF Signal Generators

Increase Signal-Generation Density

Automated radio-frequency (RF) testing uses multiple source channels to stimulate receiver inputs, drive local oscillator (LO) paths, and exercise parallel signal chains. Engineers define the number of required channels, carrier frequencies, output levels, signal formats, and timing relationships for each path. A multichannel RF signal generator can supply independently programmed signals within a shared instrument enclosure. Analog sources provide continuous-wave (CW) and other supported analog stimulus configurations; a multichannel vector source provides digitally modulated signals where the test plan requires them. The test setup connects the source outputs to a device under test (DUT), using suitable cabling, switches, attenuation, and measurement instruments. Engineers establish a channel map and confirm that the chosen instrument configuration meets the required frequency and power limits. The analog models represent different performance tiers, with specific capabilities determined from their respective data sheets.

The automated test controller configures each channel’s frequency, power, and supported modulation or trigger settings. Test sequences apply source states to the assigned DUT paths and capture the resulting receiver or conversion-stage measurements. Where phase relationships matter, engineers configure appropriate references and synchronization methods and check the applicable instrument options. Frequency and power transitions are scheduled with attention to automatic leveling correction (ALC), output blanking, settling behavior, and trigger timing. For continuous-wave measurements, leveling settings can prioritize output accuracy; for rapid state changes, engineers evaluate the relevant switching modes and tradeoffs. Separate channels may deliver different local oscillator frequencies or concurrent receiver stimuli, depending on the test architecture. Measured responses are associated with the programmed source states for subsequent comparison. The final arrangement depends on the number of required signals, the selected generator model, and the DUT interface.

Compact Multichannel RF Signal-Generation Solution

Increasing RF signal-generation density requires independently configurable RF outputs, suitable frequency and power coverage, and controlled transitions during automated sequences. The Keysight AP5012A provides up to four analog RF channels in a 1U enclosure, with frequency options reaching 40 GHz. The AP5022A supports one to four analog channels in a 2U enclosure, with options from 9 kHz up to 54 GHz. The AP5032A offers one to four analog channels in a 2U enclosure, with frequency options from 1 kHz up to 51 GHz; the 90 GHz option applies to the single-channel AP5031A, not AP5032A. The AP5042A provides one to four phase-coherent vector channels in a 2U enclosure, with frequency options up to 40 GHz and nominal maximum RF I/Q bandwidth of 400 MHz. LAN and USB remote control and supported SCPI programming integrate the sources into automated RF testing. Engineers select among these models based on stimulus format, channel count, frequency range, synchronization, and rack capacity.
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See Block Diagram of Compact Multichannel RF Signal-Generation Solution

Block diagram showing Keysight AP5012A, AP5022A, AP5032A, and AP5042A signal generators in an automated RF test system

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