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The DS1121B Bidirectional Fault Injection Probe delivers high power electromagnetic (EM) pulses to precise, user-defined locations on a target device. Its rapid pulse generation is designed to meet the stringent requirements of both commercial and certified testing environments.
Maximum frequency
1 MHz
Maximum voltage
100 V ± 10%
Technology
Device Security
Product type
Bidirectional fault injection probe
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Keysight’s Inspector software enables full control of the EMFI probe setup, including probe positioning, XY stage movement, and camera operation. The platform supports automated test execution and streamlined reports to facilitate analysis and optimization of test results. The bidirectional probe can operate independently, within customized setups, or be integrated into existing user-defined hardware and software frameworks.
With increasingly challenging chip packages and sophisticated light-sensitive sensors to prevent optical laser faults, this new testing vector for fault injection scenarios bypasses traditional measures and takes the next step in high-end security tests.
The Keysight bidirectional fault injection probe offers the following features:
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