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The DS1121B Bidirectional Fault Injection Probe delivers high power electromagnetic (EM) pulses to precise, user-defined locations on a target device. Its rapid pulse generation is designed to meet the stringent requirements of both commercial and certified testing environments.

Highlights

Keysight’s Inspector software enables full control of the EMFI probe setup, including probe positioning, XY stage movement, and camera operation. The platform supports automated test execution and streamlined reports to facilitate analysis and optimization of test results. The bidirectional probe can operate independently, within customized setups, or be integrated into existing user-defined hardware and software frameworks. 

With increasingly challenging chip packages and sophisticated light-sensitive sensors to prevent optical laser faults, this new testing vector for fault injection scenarios bypasses traditional measures and takes the next step in high-end security tests. 

The Keysight bidirectional fault injection probe offers the following features: 

  • Includes New and Improved Amplifier Unit 
  • Eliminates the need for chip de-packaging 
  • Supports configurable, high-power EM pulses with interchangeable coils for varied field profiles 
  • Allows precise adjustment of short, fast pulse characteristics via software 
  • Reduces risk of permanent device damage compared to laser-based methods 
  • Enables targeted bit flips within logic elements 
  • Compatible with Keysight precision XYZ stages and multimode laser systems for automated scanning workflows 
  • Supplied with standard EM-FI transient coils and a crescent-shaped ferrite probe 

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